Predictive test strategy for CMOS RF mixers

• Published in: Integration (Amsterdam) Vol. 42; no. 1; pp. 95 - 102
• Main Authors: Garcia-Moreno, E., Suenaga, K., Picos, R., Bota, S., Roca, M., Isern, E.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 2009
• Subjects: CMOS RF mixers; Predictive test; RF test; CMOS RF mixers; RF test; Predictive test
• ISSN: 0167-9260; 1872-7522
• DOI: 10.1016/j.vlsi.2008.09.008

In this paper, we present two built-in self-test strategies for the down-converter stage in a GSM receiver. These strategies are based on the prediction of its performance parameters from measurements in test mode. By reusing some receiver blocks as part of the test set-up, the circuitry overhead is kept small. The first strategy uses the local oscillator (LO) signal as the only test stimuli. The second strategy uses additional test circuitry, a generator, and an auxiliary mixer. Prediction accuracies are similar in both strategies, but the test observables in the second one are easier to be obtained.