BiSuT: A NoC-Based Bit-Shuffling Technique for Multiple Permanent Faults Mitigation
Since several decades, fault tolerance has become a major research field due to transistor shrinking and core number increasing in system-on-chip (SoC). Especially, faults occurring to the network-on-chips (NoCs) of those systems have a significant impact, due to the high amount of data, crossing th...
Saved in:
Published in: | IEEE transactions on computer-aided design of integrated circuits and systems Vol. 41; no. 7; pp. 2276 - 2289 |
---|---|
Main Authors: | , , , , |
Format: | Journal Article |
Language: | English |
Published: |
New York
IEEE
01-07-2022
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects: | |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Abstract | Since several decades, fault tolerance has become a major research field due to transistor shrinking and core number increasing in system-on-chip (SoC). Especially, faults occurring to the network-on-chips (NoCs) of those systems have a significant impact, due to the high amount of data, crossing the NoC, for the communication among intellectual properties (IPs). Furthermore, existing fault-tolerant approaches cannot efficiently deal with several permanent faults, which occur in NoC routers. To address these limitations, we propose the bit shuffling method (BiSuT) for fault-tolerant NoCs that reduces the impact of faults on data communications. To achieve that, the proposed approach exploits, at runtime, the position of permanent faults and changes the order of bits inside a flit. Our method reduces, as much as possible, the impact of faults by transferring the faults on least significant bits (LSBs), instead of keeping them on most significant bits (MSBs). The results obtained by extensive evaluations show that BiSuT can reduce the impact of multiple permanent faults, with low hardware costs, compared to the existing approaches, like the Hamming code. |
---|---|
AbstractList | Since several decades, fault tolerance has become a major research field due to transistor shrinking and core number increasing in system-on-chip (SoC). Especially, faults occurring to the network-on-chips (NoCs) of those systems have a significant impact, due to the high amount of data, crossing the NoC, for the communication among intellectual properties (IPs). Furthermore, existing fault-tolerant approaches cannot efficiently deal with several permanent faults, which occur in NoC routers. To address these limitations, we propose the bit shuffling method (BiSuT) for fault-tolerant NoCs that reduces the impact of faults on data communications. To achieve that, the proposed approach exploits, at runtime, the position of permanent faults and changes the order of bits inside a flit. Our method reduces, as much as possible, the impact of faults by transferring the faults on least significant bits (LSBs), instead of keeping them on most significant bits (MSBs). The results obtained by extensive evaluations show that BiSuT can reduce the impact of multiple permanent faults, with low hardware costs, compared to the existing approaches, like the Hamming code. Since several decades, fault tolerance has become a major research field due to transistor shrinking and core number increasing in System-on-Chip (SoC). Especially, faults occurring to Network-on-Chips (NoCs) of those systems have a significant impact, due to the high amount of data, crossing the NoC, for the communication among Intellectual Properties (IPs). Furthermore, existing fault tolerant approaches cannot efficiently deal with several permanent faults, which occur in NoC routers. To address these limitations, we propose the Bit Shuffling meThod (BiSuT) for fault tolerant NoCs that reduces the impact of faults on data communications. To achieve that, the proposed approach exploits, at run-time, the position of permanent faults and changes the order of bits inside a flit. Our method reduces, as much as possible, the impact of faults by transferring the faults on Least Significant Bits (LSBs), instead of keeping them on Most Significant Bits (MSBs). The results obtained by extensive evaluations show that BiSuT can reduce the impact of multiple permanent faults, with low hardware costs, compared to existing approaches, like Hamming code. |
Author | Kritikakou, Angeliki Killian, Cedric Chillet, Daniel Mercier, Romain Helen, Youri |
Author_xml | – sequence: 1 givenname: Romain orcidid: 0000-0002-9630-2833 surname: Mercier fullname: Mercier, Romain email: romain.mercier@irisa.fr organization: D3-Architecture, Univ Rennes, Inria, CNRS, IRISA, Lannion, France – sequence: 2 givenname: Cedric surname: Killian fullname: Killian, Cedric email: cedric.killian@irisa.fr organization: D3-Architecture, Univ Rennes, Inria, CNRS, IRISA, Lannion, France – sequence: 3 givenname: Angeliki orcidid: 0000-0002-9293-469X surname: Kritikakou fullname: Kritikakou, Angeliki email: angeliki.kritikakou@irisa.fr organization: D3-Architecture, Univ Rennes, Inria, CNRS, IRISA, Rennes, France – sequence: 4 givenname: Youri surname: Helen fullname: Helen, Youri email: youri.helen@intradef.gouv.fr organization: Maîtrise de l'Information, DGA MI, Rennes, France – sequence: 5 givenname: Daniel surname: Chillet fullname: Chillet, Daniel email: daniel.chillet@irisa.fr organization: D3-Architecture, Univ Rennes, Inria, CNRS, IRISA, Lannion, France |
BackLink | https://inria.hal.science/hal-03379489$$DView record in HAL |
BookMark | eNo9kF1LwzAUhoMouE1_gHgT8MqLzpOkTRrvtuqcsKmweh3SNtkyunb2Q_Df29KxqwOH53055xmjy6IsDEJ3BKaEgHyKo9nLlAIlU0aA-MAv0IhIJjyfBOQSjYCK0AMQcI3Gdb2HjgmoHKHN3G3a-BnP8EcZeXNdmwzPXeNtdq21uSu2ODbprnA_rcG2rPC6zRt3zA3-MtVBF6Zo8EJ3uxqvXeO2unFlcYOurM5rc3uaE_S9eI2jpbf6fHuPZisvZVQ0XqKF5dyCrwOSJSKhJhNSgLV-YHnAU5FxqpkkPGFSaJZJw0IgxoYQGCqszybocejd6VwdK3fQ1Z8qtVPL2Ur1O2BMSD-Uv6RjHwb2WJXdL3Wj9mVbFd15inIhwoCBFB1FBiqtyrqujD3XElC9Z9V7Vr1ndfLcZe6HjDPGnHkZdAyX7B9x2XiL |
CODEN | ITCSDI |
CitedBy_id | crossref_primary_10_1109_TVLSI_2023_3321598 crossref_primary_10_1007_s11227_022_04732_9 crossref_primary_10_3389_fnins_2023_1159440 |
Cites_doi | 10.1109/TCAD.2011.2181509 10.1109/I2C2.2017.8321939 10.1109/REDW.2002.1045524 10.1145/2145694.2145703 10.1109/TVLSI.2012.2235188 10.1109/EDTM.2018.8421433 10.1109/ISVLSI.2016.80 10.23919/DATE48585.2020.9116377 10.1007/978-1-4614-2113-9 10.1007/0-3873-1069-x_3 10.1109/CIRSYSSIM.2017.8023171 10.1109/ACCESS.2019.2959446 10.1145/611892.611918 10.1007/978-1-4614-0962-5 10.3403/30441640 10.1109/ICCD50377.2020.00046 10.1109/DFT.2008.40 10.1007/s11265-019-01476-3 10.1201/b17748 10.1016/j.mejo.2019.104620 10.1007/s10836-019-05792-1 10.1145/2886781 10.1109/TNS.2003.813137 10.1109/ICCD.2016.7753281 10.23919/DATE.2019.8714948 10.1109/ISCAS.2005.1464953 10.1145/3139540.3139542 10.1109/6.591665 10.1109/NOCS.2018.8512158 10.1007/s11227-019-02915-5 10.1109/DSN.2004.1311888 10.1145/2522968.2522976 10.1109/ICOEI48184.2020.9143002 10.1109/TDMR.2012.2204753 10.1145/3017445 10.1145/3299874.3319455 10.1016/j.mejo.2019.03.014 10.1145/3289602.3293908 10.1109/MCAS.2004.1286985 10.1109/TEST.2016.7805827 10.1109/NoCS.2013.6558401 10.3390/jlpea9010011 |
ContentType | Journal Article |
Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022 Attribution |
Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022 – notice: Attribution |
DBID | 97E RIA RIE AAYXX CITATION 7SC 7SP 8FD JQ2 L7M L~C L~D 1XC |
DOI | 10.1109/TCAD.2021.3101406 |
DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005-present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Electronic Library Online CrossRef Computer and Information Systems Abstracts Electronics & Communications Abstracts Technology Research Database ProQuest Computer Science Collection Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Academic Computer and Information Systems Abstracts Professional Hyper Article en Ligne (HAL) |
DatabaseTitle | CrossRef Technology Research Database Computer and Information Systems Abstracts – Academic Electronics & Communications Abstracts ProQuest Computer Science Collection Computer and Information Systems Abstracts Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Professional |
DatabaseTitleList | Technology Research Database |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library Online url: http://ieeexplore.ieee.org/Xplore/DynWel.jsp sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Computer Science |
EISSN | 1937-4151 |
EndPage | 2289 |
ExternalDocumentID | oai_HAL_hal_03379489v1 10_1109_TCAD_2021_3101406 9502169 |
Genre | orig-research |
GrantInformation_xml | – fundername: Directorate General of Armaments (DGA) – fundername: French Agence Nationale de la Recherche through the ANR SHNoC Project grantid: ANR-18-CE25-0006 funderid: 10.13039/501100001665 |
GroupedDBID | --Z -~X 0R~ 29I 4.4 5GY 5VS 6IK 97E AAJGR AASAJ ABQJQ ACGFS ACIWK ACNCT AENEX AETIX AI. AIBXA AKJIK ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD HZ~ H~9 IBMZZ ICLAB IFIPE IFJZH IPLJI JAVBF LAI M43 O9- OCL P2P PZZ RIA RIE RIG RNS TN5 VH1 VJK AAYXX CITATION 7SC 7SP 8FD JQ2 L7M L~C L~D 1XC |
ID | FETCH-LOGICAL-c327t-ba7f66f04a51db7b2ed7970ff45f656c7d62a3916b397a3d9e3801ef805e27f43 |
IEDL.DBID | RIE |
ISSN | 0278-0070 |
IngestDate | Wed Nov 06 06:44:38 EST 2024 Thu Oct 10 16:10:37 EDT 2024 Fri Aug 23 02:53:59 EDT 2024 Mon Nov 04 11:59:57 EST 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 7 |
Language | English |
License | Attribution: http://creativecommons.org/licenses/by |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c327t-ba7f66f04a51db7b2ed7970ff45f656c7d62a3916b397a3d9e3801ef805e27f43 |
ORCID | 0000-0002-9630-2833 0000-0002-9293-469X |
PQID | 2677853097 |
PQPubID | 85470 |
PageCount | 14 |
ParticipantIDs | hal_primary_oai_HAL_hal_03379489v1 ieee_primary_9502169 crossref_primary_10_1109_TCAD_2021_3101406 proquest_journals_2677853097 |
PublicationCentury | 2000 |
PublicationDate | 2022-07-01 |
PublicationDateYYYYMMDD | 2022-07-01 |
PublicationDate_xml | – month: 07 year: 2022 text: 2022-07-01 day: 01 |
PublicationDecade | 2020 |
PublicationPlace | New York |
PublicationPlace_xml | – name: New York |
PublicationTitle | IEEE transactions on computer-aided design of integrated circuits and systems |
PublicationTitleAbbrev | TCAD |
PublicationYear | 2022 |
Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
References | ref35 ref12 ref34 ref37 ref14 ref36 ref31 ref30 ref11 ref33 ref10 ref32 ref2 ref1 ref17 ref39 ref16 ref38 ref19 ref18 Dally (ref15) 2004 Gulli (ref45) 2017 ref24 Krizhevsky (ref46) 2009 ref23 ref26 ref25 ref47 ref42 ref41 Liva (ref20) 2016 ref22 ref44 ref21 ref43 ref28 ref27 ref29 ref8 ref7 ref9 ref4 ref3 ref6 ref5 ref40 Rusu (ref13) 2010 |
References_xml | – year: 2010 ident: ref13 article-title: Multi-level fault-tolerance in networks-on-chip contributor: fullname: Rusu – ident: ref41 doi: 10.1109/TCAD.2011.2181509 – ident: ref27 doi: 10.1109/I2C2.2017.8321939 – ident: ref12 doi: 10.1109/REDW.2002.1045524 – ident: ref47 doi: 10.1145/2145694.2145703 – ident: ref19 doi: 10.1109/TVLSI.2012.2235188 – ident: ref6 doi: 10.1109/EDTM.2018.8421433 – ident: ref24 doi: 10.1109/ISVLSI.2016.80 – ident: ref40 doi: 10.23919/DATE48585.2020.9116377 – ident: ref7 doi: 10.1007/978-1-4614-2113-9 – ident: ref10 doi: 10.1007/0-3873-1069-x_3 – ident: ref32 doi: 10.1109/CIRSYSSIM.2017.8023171 – ident: ref39 doi: 10.1109/ACCESS.2019.2959446 – ident: ref44 doi: 10.1145/611892.611918 – ident: ref14 doi: 10.1007/978-1-4614-0962-5 – ident: ref9 doi: 10.3403/30441640 – ident: ref21 doi: 10.1109/ICCD50377.2020.00046 – ident: ref34 doi: 10.1109/DFT.2008.40 – volume-title: Learning Multiple Layers of Features From Tiny Images year: 2009 ident: ref46 contributor: fullname: Krizhevsky – ident: ref28 doi: 10.1007/s11265-019-01476-3 – ident: ref8 doi: 10.1201/b17748 – ident: ref18 doi: 10.1016/j.mejo.2019.104620 – ident: ref42 doi: 10.1007/s10836-019-05792-1 – volume-title: Principles and Practices of Interconnection Networks year: 2004 ident: ref15 contributor: fullname: Dally – ident: ref17 doi: 10.1145/2886781 – ident: ref11 doi: 10.1109/TNS.2003.813137 – ident: ref23 doi: 10.1109/ICCD.2016.7753281 – ident: ref25 doi: 10.23919/DATE.2019.8714948 – ident: ref2 doi: 10.1109/ISCAS.2005.1464953 – ident: ref4 doi: 10.1145/3139540.3139542 – ident: ref1 doi: 10.1109/6.591665 – ident: ref22 doi: 10.1109/NOCS.2018.8512158 – volume-title: Code design for short blocks: A survey year: 2016 ident: ref20 contributor: fullname: Liva – ident: ref26 doi: 10.1007/s11227-019-02915-5 – ident: ref5 doi: 10.1109/DSN.2004.1311888 – ident: ref16 doi: 10.1145/2522968.2522976 – ident: ref33 doi: 10.1109/ICOEI48184.2020.9143002 – ident: ref35 doi: 10.1109/TDMR.2012.2204753 – ident: ref38 doi: 10.1145/3017445 – ident: ref36 doi: 10.1145/3299874.3319455 – ident: ref31 doi: 10.1016/j.mejo.2019.03.014 – ident: ref3 doi: 10.1145/3289602.3293908 – ident: ref37 doi: 10.1109/MCAS.2004.1286985 – ident: ref43 doi: 10.1109/TEST.2016.7805827 – ident: ref30 doi: 10.1109/NoCS.2013.6558401 – volume-title: Deep Learning With Keras year: 2017 ident: ref45 contributor: fullname: Gulli – ident: ref29 doi: 10.3390/jlpea9010011 |
SSID | ssj0014529 |
Score | 2.4308097 |
Snippet | Since several decades, fault tolerance has become a major research field due to transistor shrinking and core number increasing in system-on-chip (SoC).... Since several decades, fault tolerance has become a major research field due to transistor shrinking and core number increasing in System-on-Chip (SoC).... |
SourceID | hal proquest crossref ieee |
SourceType | Open Access Repository Aggregation Database Publisher |
StartPage | 2276 |
SubjectTerms | Approximate computing bit-shuffling Circuit faults Computer Science Data communication fault mitigation Fault tolerance Fault tolerant systems Faults Hardware Hardware Architecture MBU multiple faults network-on-chip Power demand Redundancy Routers Routing System on chip Transistors |
Title | BiSuT: A NoC-Based Bit-Shuffling Technique for Multiple Permanent Faults Mitigation |
URI | https://ieeexplore.ieee.org/document/9502169 https://www.proquest.com/docview/2677853097 https://inria.hal.science/hal-03379489 |
Volume | 41 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1Lb9swDCaWnLbD1seGZc0KoeipqFdbsiyrtyRNkEMTFEgK9GbIeqC5OMUS7_eXdJygw3bpzRD8JGWSn0h-Arg0zkulcxEZbi0CFOMio4WMpLJBZKktU0f9ztOFmj_ld2Oiybk-9MJ475viM_-LDptcvlvbmpbKbrREj5TpDnTw9rterUPGgBKIzXoKMcbiPG4zmEmsb5b4UYgEeYIAlQBF9pcP6jxTBWSztco_9rhxMpMv73u9I_jcBpNssNP-MXzw1Ql8ekMxeAqL4WpRL2_ZgM3Xo2iIPsux4WobLZ7rEKgVnS33LK4M41c2awsM2QOZ7AofyCYGxzZsttrRcayrr_A4GS9H06jdSCGygqttVBoVsizEqZGJK1XJvVNaxSGkMmA8Z5XLuKEO3BKjEyOc9gIdlw95LD1XIRXfoFutK_8dWJanwaJR4KkqMZJyOSJzlzuZZ4kJTtgeXO1FW7zs-DKKBmfEuiA9FKSHotVDDy5Q-IfziOl6OrgvaCwWAi1Frv8kPTglUR_OaqXcg_5eV0X7220KTnR4UsRa_fj_VWfwkVP_QlNv24fu9nftf0Jn4-rzZjq9Aufqxa8 |
link.rule.ids | 230,315,782,786,798,887,27933,27934,54767 |
linkProvider | IEEE |
linkToHtml | http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3db9MwED_R8QA88DUmygZYiCdEWBLHdsxbO1YV0VZIDRJvluMPrS8pos3-_t2lacXEXvYWWY6S3Dl39_Pd_Qzw0foglC55YnPnEKBYn1jNRSKUi1wWri489TtPl2rxu_x2STQ5nw-9MCGErvgsfKHLLpfv166lrbJzLdAjST2Ah6JQUu26tQ45A0ohdjsqxBmLK7nPYWapPq_wsxAL5hlCVIIU8pYXGlxRDWR3uMp_FrlzM5Nn93vB5_C0DyfZaKf_F_AgNC_hyT8kg8ewHK-WbfWVjdhifZGM0Wt5Nl5tk-VVGyM1o7Nqz-PKMIJl877EkP0ko93gA9nE4tiGzVc7Qo518wp-TS6ri2nSH6WQOJ6rbVJbFaWMaWFF5mtV58ErrdIYCxExonPKy9xSD26N8YnlXgeOrivEMhUhV7HgJ3DUrJvwGpgsi-jQLOSFqjGW8iVic196UcrMRs_dED7tRWv-7BgzTIc0Um1ID4b0YHo9DOEDCv8wj7iup6OZobGUc7QVpb7OhnBMoj7M6qU8hLO9rkz_421MToR4gqdavbn7rvfwaFrNZ2b2ffHjFB7n1M3QVd-ewdH2bxvewmDj23fd0roBfVjJAA |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=BiSuT%3A+A+NoC-Based+Bit-Shuffling+Technique+for+Multiple+Permanent+Faults+Mitigation&rft.jtitle=IEEE+transactions+on+computer-aided+design+of+integrated+circuits+and+systems&rft.au=Mercier%2C+Romain&rft.au=Killian%2C+Cedric&rft.au=Kritikakou%2C+Angeliki&rft.au=Helen%2C+Youri&rft.date=2022-07-01&rft.pub=IEEE&rft.issn=0278-0070&rft.volume=41&rft.issue=7&rft.spage=2276&rft.epage=2289&rft_id=info:doi/10.1109%2FTCAD.2021.3101406&rft.externalDocID=9502169 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0278-0070&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0278-0070&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0278-0070&client=summon |