BiSuT: A NoC-Based Bit-Shuffling Technique for Multiple Permanent Faults Mitigation

Since several decades, fault tolerance has become a major research field due to transistor shrinking and core number increasing in system-on-chip (SoC). Especially, faults occurring to the network-on-chips (NoCs) of those systems have a significant impact, due to the high amount of data, crossing th...

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Published in:IEEE transactions on computer-aided design of integrated circuits and systems Vol. 41; no. 7; pp. 2276 - 2289
Main Authors: Mercier, Romain, Killian, Cedric, Kritikakou, Angeliki, Helen, Youri, Chillet, Daniel
Format: Journal Article
Language:English
Published: New York IEEE 01-07-2022
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Abstract Since several decades, fault tolerance has become a major research field due to transistor shrinking and core number increasing in system-on-chip (SoC). Especially, faults occurring to the network-on-chips (NoCs) of those systems have a significant impact, due to the high amount of data, crossing the NoC, for the communication among intellectual properties (IPs). Furthermore, existing fault-tolerant approaches cannot efficiently deal with several permanent faults, which occur in NoC routers. To address these limitations, we propose the bit shuffling method (BiSuT) for fault-tolerant NoCs that reduces the impact of faults on data communications. To achieve that, the proposed approach exploits, at runtime, the position of permanent faults and changes the order of bits inside a flit. Our method reduces, as much as possible, the impact of faults by transferring the faults on least significant bits (LSBs), instead of keeping them on most significant bits (MSBs). The results obtained by extensive evaluations show that BiSuT can reduce the impact of multiple permanent faults, with low hardware costs, compared to the existing approaches, like the Hamming code.
AbstractList Since several decades, fault tolerance has become a major research field due to transistor shrinking and core number increasing in system-on-chip (SoC). Especially, faults occurring to the network-on-chips (NoCs) of those systems have a significant impact, due to the high amount of data, crossing the NoC, for the communication among intellectual properties (IPs). Furthermore, existing fault-tolerant approaches cannot efficiently deal with several permanent faults, which occur in NoC routers. To address these limitations, we propose the bit shuffling method (BiSuT) for fault-tolerant NoCs that reduces the impact of faults on data communications. To achieve that, the proposed approach exploits, at runtime, the position of permanent faults and changes the order of bits inside a flit. Our method reduces, as much as possible, the impact of faults by transferring the faults on least significant bits (LSBs), instead of keeping them on most significant bits (MSBs). The results obtained by extensive evaluations show that BiSuT can reduce the impact of multiple permanent faults, with low hardware costs, compared to the existing approaches, like the Hamming code.
Since several decades, fault tolerance has become a major research field due to transistor shrinking and core number increasing in System-on-Chip (SoC). Especially, faults occurring to Network-on-Chips (NoCs) of those systems have a significant impact, due to the high amount of data, crossing the NoC, for the communication among Intellectual Properties (IPs). Furthermore, existing fault tolerant approaches cannot efficiently deal with several permanent faults, which occur in NoC routers. To address these limitations, we propose the Bit Shuffling meThod (BiSuT) for fault tolerant NoCs that reduces the impact of faults on data communications. To achieve that, the proposed approach exploits, at run-time, the position of permanent faults and changes the order of bits inside a flit. Our method reduces, as much as possible, the impact of faults by transferring the faults on Least Significant Bits (LSBs), instead of keeping them on Most Significant Bits (MSBs). The results obtained by extensive evaluations show that BiSuT can reduce the impact of multiple permanent faults, with low hardware costs, compared to existing approaches, like Hamming code.
Author Kritikakou, Angeliki
Killian, Cedric
Chillet, Daniel
Mercier, Romain
Helen, Youri
Author_xml – sequence: 1
  givenname: Romain
  orcidid: 0000-0002-9630-2833
  surname: Mercier
  fullname: Mercier, Romain
  email: romain.mercier@irisa.fr
  organization: D3-Architecture, Univ Rennes, Inria, CNRS, IRISA, Lannion, France
– sequence: 2
  givenname: Cedric
  surname: Killian
  fullname: Killian, Cedric
  email: cedric.killian@irisa.fr
  organization: D3-Architecture, Univ Rennes, Inria, CNRS, IRISA, Lannion, France
– sequence: 3
  givenname: Angeliki
  orcidid: 0000-0002-9293-469X
  surname: Kritikakou
  fullname: Kritikakou, Angeliki
  email: angeliki.kritikakou@irisa.fr
  organization: D3-Architecture, Univ Rennes, Inria, CNRS, IRISA, Rennes, France
– sequence: 4
  givenname: Youri
  surname: Helen
  fullname: Helen, Youri
  email: youri.helen@intradef.gouv.fr
  organization: Maîtrise de l'Information, DGA MI, Rennes, France
– sequence: 5
  givenname: Daniel
  surname: Chillet
  fullname: Chillet, Daniel
  email: daniel.chillet@irisa.fr
  organization: D3-Architecture, Univ Rennes, Inria, CNRS, IRISA, Lannion, France
BackLink https://inria.hal.science/hal-03379489$$DView record in HAL
BookMark eNo9kF1LwzAUhoMouE1_gHgT8MqLzpOkTRrvtuqcsKmweh3SNtkyunb2Q_Df29KxqwOH53055xmjy6IsDEJ3BKaEgHyKo9nLlAIlU0aA-MAv0IhIJjyfBOQSjYCK0AMQcI3Gdb2HjgmoHKHN3G3a-BnP8EcZeXNdmwzPXeNtdq21uSu2ODbprnA_rcG2rPC6zRt3zA3-MtVBF6Zo8EJ3uxqvXeO2unFlcYOurM5rc3uaE_S9eI2jpbf6fHuPZisvZVQ0XqKF5dyCrwOSJSKhJhNSgLV-YHnAU5FxqpkkPGFSaJZJw0IgxoYQGCqszybocejd6VwdK3fQ1Z8qtVPL2Ur1O2BMSD-Uv6RjHwb2WJXdL3Wj9mVbFd15inIhwoCBFB1FBiqtyrqujD3XElC9Z9V7Vr1ndfLcZe6HjDPGnHkZdAyX7B9x2XiL
CODEN ITCSDI
CitedBy_id crossref_primary_10_1109_TVLSI_2023_3321598
crossref_primary_10_1007_s11227_022_04732_9
crossref_primary_10_3389_fnins_2023_1159440
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ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022
Attribution
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022
– notice: Attribution
DBID 97E
RIA
RIE
AAYXX
CITATION
7SC
7SP
8FD
JQ2
L7M
L~C
L~D
1XC
DOI 10.1109/TCAD.2021.3101406
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005-present
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library Online
CrossRef
Computer and Information Systems Abstracts
Electronics & Communications Abstracts
Technology Research Database
ProQuest Computer Science Collection
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts – Academic
Computer and Information Systems Abstracts Professional
Hyper Article en Ligne (HAL)
DatabaseTitle CrossRef
Technology Research Database
Computer and Information Systems Abstracts – Academic
Electronics & Communications Abstracts
ProQuest Computer Science Collection
Computer and Information Systems Abstracts
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts Professional
DatabaseTitleList

Technology Research Database
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library Online
  url: http://ieeexplore.ieee.org/Xplore/DynWel.jsp
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Computer Science
EISSN 1937-4151
EndPage 2289
ExternalDocumentID oai_HAL_hal_03379489v1
10_1109_TCAD_2021_3101406
9502169
Genre orig-research
GrantInformation_xml – fundername: Directorate General of Armaments (DGA)
– fundername: French Agence Nationale de la Recherche through the ANR SHNoC Project
  grantid: ANR-18-CE25-0006
  funderid: 10.13039/501100001665
GroupedDBID --Z
-~X
0R~
29I
4.4
5GY
5VS
6IK
97E
AAJGR
AASAJ
ABQJQ
ACGFS
ACIWK
ACNCT
AENEX
AETIX
AI.
AIBXA
AKJIK
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ASUFR
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
HZ~
H~9
IBMZZ
ICLAB
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
O9-
OCL
P2P
PZZ
RIA
RIE
RIG
RNS
TN5
VH1
VJK
AAYXX
CITATION
7SC
7SP
8FD
JQ2
L7M
L~C
L~D
1XC
ID FETCH-LOGICAL-c327t-ba7f66f04a51db7b2ed7970ff45f656c7d62a3916b397a3d9e3801ef805e27f43
IEDL.DBID RIE
ISSN 0278-0070
IngestDate Wed Nov 06 06:44:38 EST 2024
Thu Oct 10 16:10:37 EDT 2024
Fri Aug 23 02:53:59 EDT 2024
Mon Nov 04 11:59:57 EST 2024
IsPeerReviewed true
IsScholarly true
Issue 7
Language English
License Attribution: http://creativecommons.org/licenses/by
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c327t-ba7f66f04a51db7b2ed7970ff45f656c7d62a3916b397a3d9e3801ef805e27f43
ORCID 0000-0002-9630-2833
0000-0002-9293-469X
PQID 2677853097
PQPubID 85470
PageCount 14
ParticipantIDs hal_primary_oai_HAL_hal_03379489v1
ieee_primary_9502169
crossref_primary_10_1109_TCAD_2021_3101406
proquest_journals_2677853097
PublicationCentury 2000
PublicationDate 2022-07-01
PublicationDateYYYYMMDD 2022-07-01
PublicationDate_xml – month: 07
  year: 2022
  text: 2022-07-01
  day: 01
PublicationDecade 2020
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE transactions on computer-aided design of integrated circuits and systems
PublicationTitleAbbrev TCAD
PublicationYear 2022
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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SSID ssj0014529
Score 2.4308097
Snippet Since several decades, fault tolerance has become a major research field due to transistor shrinking and core number increasing in system-on-chip (SoC)....
Since several decades, fault tolerance has become a major research field due to transistor shrinking and core number increasing in System-on-Chip (SoC)....
SourceID hal
proquest
crossref
ieee
SourceType Open Access Repository
Aggregation Database
Publisher
StartPage 2276
SubjectTerms Approximate computing
bit-shuffling
Circuit faults
Computer Science
Data communication
fault mitigation
Fault tolerance
Fault tolerant systems
Faults
Hardware
Hardware Architecture
MBU
multiple faults
network-on-chip
Power demand
Redundancy
Routers
Routing
System on chip
Transistors
Title BiSuT: A NoC-Based Bit-Shuffling Technique for Multiple Permanent Faults Mitigation
URI https://ieeexplore.ieee.org/document/9502169
https://www.proquest.com/docview/2677853097
https://inria.hal.science/hal-03379489
Volume 41
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1Lb9swDCaWnLbD1seGZc0KoeipqFdbsiyrtyRNkEMTFEgK9GbIeqC5OMUS7_eXdJygw3bpzRD8JGWSn0h-Arg0zkulcxEZbi0CFOMio4WMpLJBZKktU0f9ztOFmj_ld2Oiybk-9MJ475viM_-LDptcvlvbmpbKbrREj5TpDnTw9rterUPGgBKIzXoKMcbiPG4zmEmsb5b4UYgEeYIAlQBF9pcP6jxTBWSztco_9rhxMpMv73u9I_jcBpNssNP-MXzw1Ql8ekMxeAqL4WpRL2_ZgM3Xo2iIPsux4WobLZ7rEKgVnS33LK4M41c2awsM2QOZ7AofyCYGxzZsttrRcayrr_A4GS9H06jdSCGygqttVBoVsizEqZGJK1XJvVNaxSGkMmA8Z5XLuKEO3BKjEyOc9gIdlw95LD1XIRXfoFutK_8dWJanwaJR4KkqMZJyOSJzlzuZZ4kJTtgeXO1FW7zs-DKKBmfEuiA9FKSHotVDDy5Q-IfziOl6OrgvaCwWAi1Frv8kPTglUR_OaqXcg_5eV0X7220KTnR4UsRa_fj_VWfwkVP_QlNv24fu9nftf0Jn4-rzZjq9Aufqxa8
link.rule.ids 230,315,782,786,798,887,27933,27934,54767
linkProvider IEEE
linkToHtml http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3db9MwED_R8QA88DUmygZYiCdEWBLHdsxbO1YV0VZIDRJvluMPrS8pos3-_t2lacXEXvYWWY6S3Dl39_Pd_Qzw0foglC55YnPnEKBYn1jNRSKUi1wWri489TtPl2rxu_x2STQ5nw-9MCGErvgsfKHLLpfv166lrbJzLdAjST2Ah6JQUu26tQ45A0ohdjsqxBmLK7nPYWapPq_wsxAL5hlCVIIU8pYXGlxRDWR3uMp_FrlzM5Nn93vB5_C0DyfZaKf_F_AgNC_hyT8kg8ewHK-WbfWVjdhifZGM0Wt5Nl5tk-VVGyM1o7Nqz-PKMIJl877EkP0ko93gA9nE4tiGzVc7Qo518wp-TS6ri2nSH6WQOJ6rbVJbFaWMaWFF5mtV58ErrdIYCxExonPKy9xSD26N8YnlXgeOrivEMhUhV7HgJ3DUrJvwGpgsi-jQLOSFqjGW8iVic196UcrMRs_dED7tRWv-7BgzTIc0Um1ID4b0YHo9DOEDCv8wj7iup6OZobGUc7QVpb7OhnBMoj7M6qU8hLO9rkz_421MToR4gqdavbn7rvfwaFrNZ2b2ffHjFB7n1M3QVd-ewdH2bxvewmDj23fd0roBfVjJAA
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=BiSuT%3A+A+NoC-Based+Bit-Shuffling+Technique+for+Multiple+Permanent+Faults+Mitigation&rft.jtitle=IEEE+transactions+on+computer-aided+design+of+integrated+circuits+and+systems&rft.au=Mercier%2C+Romain&rft.au=Killian%2C+Cedric&rft.au=Kritikakou%2C+Angeliki&rft.au=Helen%2C+Youri&rft.date=2022-07-01&rft.pub=IEEE&rft.issn=0278-0070&rft.volume=41&rft.issue=7&rft.spage=2276&rft.epage=2289&rft_id=info:doi/10.1109%2FTCAD.2021.3101406&rft.externalDocID=9502169
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0278-0070&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0278-0070&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0278-0070&client=summon