Etching with electron beam generated plasmas
A modulated electron beam generated plasma has been used to dry etch standard photoresist materials and silicon. Oxygen–argon mixtures were used to etch organic resist material and sulfur hexafluoride mixed with argon or oxygen was used for the silicon etching. Etch rates and anisotropy were determi...
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Published in: | Journal of vacuum science & technology. A, Vacuum, surfaces, and films Vol. 22; no. 6; pp. 2276 - 2283 |
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Main Authors: | , , , , |
Format: | Journal Article |
Language: | English |
Published: |
United States
01-11-2004
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Subjects: | |
Online Access: | Get full text |
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