RADAR CROSS SECTION CHARACTERIZATION OF CORNER REFLECTORS IN DIFFERENT FREQUENCY BANDS AND POLARIZATIONS

• Published in: International archives of the photogrammetry, remote sensing and spatial information sciences. Vol. XLII-5; pp. 637 - 642
• Main Authors: Jayasri, P. V., Niharika, K., Yedukondalu, K., Sita Kumari, E. V. S., Prasad, A. V. V.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Gottingen Copernicus GmbH 19-11-2018; Copernicus Publications
• Subjects: Angle of reflection; Antennas; Archives & records; Band theory; Calibration; Design; Information science; Photogrammetry; Radar; Radar cross sections; Radar targets; Reflectors; Remote sensing; SAR (radar); Sensors; Superhigh frequencies; Synthetic aperture radar
• ISSN: 2194-9034; 1682-1750; 2194-9034
• DOI: 10.5194/isprs-archives-xlii-5-637-2018

Corner Reflectors (CR) are standard passive radar targets which offer one of the best solutions for SAR calibration. Radar Cross Section (RCS) of corner reflectors plays a vital role for estimation of calibration parameters and hence back scatter coefficient for airborne and spaceborne SAR images. There is a stringent requirement to characterize RCS of corner reflectors by measuring its scattering properties in a controlled environment. RCS characterization of square trihedral corner reflectors, dihedrals including polarization selective dihedrals is addressed. These measurements were carried out at X, C and S band frequencies with wide scan angles at definite sampling interval. The design details of corner reflectors, specifications of Compact Antenna Test Range Facility, technical modalities involved for RCS measurements, variation of measured RCS from theoretical value for trihedral and dihedral reflectors at different frequency bands and polarizations are presented in this paper.