The Investigation of Ferroelectric Domain Behavior Affected by Thin Metallic Electrode

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Bibliographic Details
Published in:	Japanese Journal of Applied Physics Vol. 45; no. 3S; p. 1981
Main Authors:	Kim, Jong-Hun, Baek, J., Khim, Z. G., Shin, Sangmin, Koo, June-Mo, Kim, Suk-Pil, Park, Youngsoo
Format:	Journal Article
Language:	English
Published:	01-03-2006
Online Access:	Get full text
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Description
ISSN:	0021-4922 1347-4065
DOI:	10.1143/JJAP.45.1981