Analysis of mineral water from Brazil using total reflection X-ray fluorescence by synchrotron radiation

• Published in: Spectrochimica acta. Part B: Atomic spectroscopy Vol. 58; no. 12; pp. 2199 - 2204
• Main Authors: Costa, A.C.M, Anjos, M.J, Moreira, S, Lopes, R.T, de Jesus, E.F.O
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 15-12-2003
• Subjects: Mineral water; Synchrotron radiation; Trace elements; TXRF; Brazil, Sao Paulo, Campinas; Trace elements; Synchrotron radiation; Mineral water; TXRF
• ISSN: 0584-8547; 1873-3565
• DOI: 10.1016/j.sab.2003.07.002

The total reflection X-ray fluorescence using synchrotron radiation (SRTXRF) has become a competitive technique for the determination of trace elements in samples that the concentrations are lower than 100 ng ml
−1. In this work, thirty-seven mineral waters commonly available in supermarkets of Rio de Janeiro, Brazil, were analyzed by SRTXRF. The measurements were performed at the X-Ray Fluorescence Beamline at Brazilian National Synchrotron Light Laboratory (LNLS), in Campinas, São Paulo, using a polychromatic beam with maximum energy of 20 keV for the excitation. Standard solutions with gallium as internal standard were prepared for calibration of the system. Mineral water samples of 10 μl were added to Perspex sample carrier, dried under infrared lamp and analyzed for 200 s measuring time. It was possible to determine the concentrations of the following elements: Si, S, K, Ca, Ti, Cr, Mn, Ni, Cu, Zn, Ge, Rb, Sr, Ba and Pb. The elemental concentration values were compared with the limits established by the Brazilian legislation.