Probing magnetic and electric optical responses of silicon nanoparticles

• Published in: Applied physics letters Vol. 106; no. 17
• Main Authors: Permyakov, Dmitry, Sinev, Ivan, Markovich, Dmitry, Ginzburg, Pavel, Samusev, Anton, Belov, Pavel, Valuckas, Vytautas, Kuznetsov, Arseniy I., Luk'yanchuk, Boris S., Miroshnichenko, Andrey E., Neshev, Dragomir N., Kivshar, Yuri S.
• Format: Journal Article
• Language: English
• Published: Melville American Institute of Physics 27-04-2015
• Subjects: Applied physics; ASYMMETRY; Beams (radiation); ELECTRIC DIPOLES; ENERGY SPECTRA; EXCITATION; MAGNETIC DIPOLES; Magnetic resonance; Microscopes; NANOPARTICLES; NANOSCIENCE AND NANOTECHNOLOGY; NANOSTRUCTURES; Optical microscopy; Photonics; POLARIZATION; PROBES; SCANNING LIGHT MICROSCOPY; SCATTERING; SENSITIVITY; SILICON; Spectral sensitivity; Spectrum analysis
• ISSN: 0003-6951; 1077-3118
• DOI: 10.1063/1.4919536

We study experimentally both magnetic and electric optically induced resonances of silicon nanoparticles by combining polarization-resolved dark-field spectroscopy and near-field scanning optical microscopy measurements. We reveal that the scattering spectra exhibit strong sensitivity of electric dipole response to the probing beam polarization and attribute the characteristic asymmetry of measured near-field patterns to the excitation of a magnetic dipole mode. The proposed experimental approach can serve as a powerful tool for the study of photonic nanostructures possessing both electric and magnetic optical responses.