Force feedback microscopy based on an optical beam deflection scheme

Force feedback microscopy based on an optical beam deflection scheme

Force feedback microscopy circumvents the jump to contact in atomic force microscopy when using soft cantilevers and quantitatively measures the interaction properties at the nanoscale by simultaneously providing force, force gradient, and dissipation. The force feedback microscope developed so far...

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Bibliographic Details
Published in:Applied physics letters Vol. 105; no. 1
Main Authors: Vitorino, Miguel V., Carpentier, Simon, Costa, Luca, Rodrigues, Mario S.
Format: Journal Article
Language:English
Published: Melville American Institute of Physics 07-07-2014
Subjects:
Applied physics
ATOMIC FORCE MICROSCOPY
BEAMS
Brownian motion
BROWNIAN MOVEMENT
CAVITY RESONATORS
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
EVOLUTION
FEEDBACK
INTERACTIONS
MICROSCOPES
Microscopy
NANOSTRUCTURES
Optical beam deflection
Physics
WATER
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Summary:Force feedback microscopy circumvents the jump to contact in atomic force microscopy when using soft cantilevers and quantitatively measures the interaction properties at the nanoscale by simultaneously providing force, force gradient, and dissipation. The force feedback microscope developed so far used an optical cavity to measure the tip displacement. In this Letter, we show that the more conventional optical beam deflection scheme can be used to the same purpose. With this instrument, we have followed the evolution of the Brownian motion of the tip under the influence of a water bridge.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4887484