Enhancing supervised bug localization with metadata and stack-trace

Locating relevant source files for a given bug report is an important task in software development and maintenance. To make the locating process easier, information retrieval methods have been widely used to compute the content similarities between bug reports and source files. In addition to conten...

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Published in:Knowledge and information systems Vol. 62; no. 6; pp. 2461 - 2484
Main Authors: Wang, Yaojing, Yao, Yuan, Tong, Hanghang, Huo, Xuan, Li, Ming, Xu, Feng, Lu, Jian
Format: Journal Article
Language:English
Published: London Springer London 01-06-2020
Springer Nature B.V
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Abstract Locating relevant source files for a given bug report is an important task in software development and maintenance. To make the locating process easier, information retrieval methods have been widely used to compute the content similarities between bug reports and source files. In addition to content similarities, various other sources of information such as the metadata and the stack-trace in the bug report can be used to enhance the localization accuracy. In this paper, we propose a supervised topic modeling approach for automatically locating the relevant source files of a bug report. In our approach, we take into account the following five key observations. First, supervised modeling can effectively make use of the existing fixing histories. Second, certain words in bug reports tend to appear multiple times in their relevant source files. Third, longer source files tend to have more bugs. Fourth, metainformation brings additional guidance on the search space. Fifth, buggy source files could be already contained in the stack-trace. By integrating the above five observations, we experimentally show that the proposed method can achieve up to 67.1% improvement in terms of prediction accuracy over its best competitors and scales linearly with the size of the data.
AbstractList Locating relevant source files for a given bug report is an important task in software development and maintenance. To make the locating process easier, information retrieval methods have been widely used to compute the content similarities between bug reports and source files. In addition to content similarities, various other sources of information such as the metadata and the stack-trace in the bug report can be used to enhance the localization accuracy. In this paper, we propose a supervised topic modeling approach for automatically locating the relevant source files of a bug report. In our approach, we take into account the following five key observations. First, supervised modeling can effectively make use of the existing fixing histories. Second, certain words in bug reports tend to appear multiple times in their relevant source files. Third, longer source files tend to have more bugs. Fourth, metainformation brings additional guidance on the search space. Fifth, buggy source files could be already contained in the stack-trace. By integrating the above five observations, we experimentally show that the proposed method can achieve up to 67.1% improvement in terms of prediction accuracy over its best competitors and scales linearly with the size of the data.
Author Tong, Hanghang
Li, Ming
Xu, Feng
Lu, Jian
Yao, Yuan
Wang, Yaojing
Huo, Xuan
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Keywords Bug reports
Supervised topic modeling
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Bug localization
Stack-trace
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Snippet Locating relevant source files for a given bug report is an important task in software development and maintenance. To make the locating process easier,...
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SubjectTerms Accuracy
Analogies
Computer Science
Data Mining and Knowledge Discovery
Database Management
Debugging
Information retrieval
Information Storage and Retrieval
Information Systems and Communication Service
Information Systems Applications (incl.Internet)
IT in Business
Localization
Metadata
Modelling
Regular Paper
Software development
Title Enhancing supervised bug localization with metadata and stack-trace
URI https://link.springer.com/article/10.1007/s10115-019-01426-2
https://www.proquest.com/docview/2399055366
Volume 62
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