Establishing a protocol for measurements of fractal dimensions in brittle materials
Many techniques have been used to measure the fractal dimension of brittle fracture surfaces. The purpose of this study was to create a protocol for obtaining the fractal dimension using a simplified optical technique for comparison to reported procedures. Four classes of ceramic materials were used...
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Published in: | Journal of materials science Vol. 36; no. 11; pp. 2651 - 2657 |
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01-06-2001
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Abstract | Many techniques have been used to measure the fractal dimension of brittle fracture surfaces. The purpose of this study was to create a protocol for obtaining the fractal dimension using a simplified optical technique for comparison to reported procedures. Four classes of ceramic materials were used in this study: baria silicate (a glass-ceramic), silicon nitride (a fine grain polycrystalline ceramic), zinc selenide (a large grain polycrystalline ceramic), and silicon (a single crystal ceramic). Contours were produced in perpendicular and parallel planes to the fracture surface using three techniques: slit-island (parallel), profile technique (perpendicular), and crack indentation technique (perpendicular). These contours were then analyzed using a method first introduced by Richardson. The slit-island technique produced statistically greater fractal dimensional increments, ranging from 0.08 to 0.28 for all the materials, than either the profile technique (0.01 to 0.03) or the indentation technique (0.02–0.05). This difference is due in part to the fact that many brittle fracture surfaces are self-affine objects and not self-similar objects. A list of recommendations for a protocol and sources of error for this technique are presented in the appendices. |
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AbstractList | Many techniques have been used to measure the fractal dimension of brittle fracture surfaces. The purpose of this study was to create a protocol for obtaining the fractal dimension using a simplified optical technique for comparison to reported procedures. Four classes of ceramic materials were used in this study: baria silicate (a glass-ceramic), silicon nitride (a fine grain polycrystalline ceramic), zinc selenide (a large grain polycrystalline ceramic), and silicon (a single crystal ceramic). Contours were produced in perpendicular and parallel planes to the fracture surface using three techniques: slit-island (parallel), profile technique (perpendicular), and crack indentation technique (perpendicular). These contours were then analyzed using a method first introduced by Richardson. The slit-island technique produced statistically greater fractal dimensional increments, ranging from 0.08 to 0.28 for all the materials, than either the profile technique (0.01 to 0.03) or the indentation technique (0.02–0.05). This difference is due in part to the fact that many brittle fracture surfaces are self-affine objects and not self-similar objects. A list of recommendations for a protocol and sources of error for this technique are presented in the appendices. Many techniques have been used to measure the fractal dimension of brittle fracture surfaces. The purpose of this study was to create a protocol for obtaining the fractal dimension using a simplified optical technique for comparison with reported procedures. Four classes of ceramic materials were used in the study: barium silicate (a glass-ceramic), silicon nitride (a fine grain polycrystalline ceramic), zinc selenide (a large grain polycrystalline ceramic), and silicon (a single crystal ceramic). Contours were produced in perpendicular and parallel planes to the fracture surface using three techniques: slit-island (parallel), profile technique (perpendicular), and crack indentation technique (perpendicular). These contours were then analysed using a method first introduced by Richardson. The slit-island technique produced statistically greater fractal dimensional increments, ranging from 0.08 to 0.28 for all the materials, then either the profile technique (0.01 to 0.03) or the indentation technique (0.02-0.05). This difference is due in part to the fact that many brittle fracture surfaces are self-affine objects and not self-similar objects. A list of recommendations for a protocol and sources of error for this technique are presented in the appendices. 32 refs. Many techniques have been used to measure the fractal dimension of brittle fracture surfaces. The purpose of this study was to create a protocol for obtaining the fractal dimension using a simplified optical technique for comparison to reported procedures. Four classes of ceramic materials were used in this study: baria silicate (a glass-ceramic), silicon nitride (a fine grain polycrystalline ceramic), zinc selenide (a large grain polycrystalline ceramic), and silicon (a single crystal ceramic). Contours were produced in perpendicular and parallel planes to the fracture surface using three techniques: slit-island (parallel), profile technique (perpendicular), and crack indentation technique (perpendicular). These contours were then analyzed using a method first introduced by Richardson. The slit-island technique produced statistically greater fractal dimensional increments, ranging from 0.08 to 0.28 for all the materials, than either the profile technique (0.01 to 0.03) or the indentation technique (0.02-0.05). This difference is due in part to the fact that many brittle fracture surfaces are self-affine objects and not self-similar objects. A list of recommendations for a protocol and sources of error for this technique are presented in the appendices. copyright 2001 Kluwer Academic Publishers. |
Author | HILL, T. J MECHOLSKY, J. J DELLA BONA, A |
Author_xml | – sequence: 1 givenname: T. J surname: HILL fullname: HILL, T. J organization: Departments of Material Sciences and Engineering and Dental Biomaterials, University of Florida, Gainesville, FL, 32611, United States – sequence: 2 givenname: A surname: DELLA BONA fullname: DELLA BONA, A organization: Departments of Material Sciences and Engineering and Dental Biomaterials, University of Florida, Gainesville, FL, 32611, United States – sequence: 3 givenname: J. J surname: MECHOLSKY fullname: MECHOLSKY, J. J organization: Departments of Material Sciences and Engineering and Dental Biomaterials, University of Florida, Gainesville, FL, 32611, United States |
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Copyright | 2001 INIST-CNRS Journal of Materials Science is a copyright of Springer, (2001). All Rights Reserved. |
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Keywords | Fractal dimension Silicon Nitrides Barium Silicates Brittle material Silicon Fracture surface Measurement method Zinc Selenides Experimental study Glass ceramics Non oxide ceramics |
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SubjectTerms | Applied sciences Brittle fracture Brittle materials Building materials. Ceramics. Glasses Ceramic industries Chemical industry and chemicals Contours Exact sciences and technology Fractal geometry Fractals Fracture surfaces General studies Glass ceramics Indentation Materials science Polycrystals Self-similarity Silicon nitride Single crystals Technical ceramics |
Title | Establishing a protocol for measurements of fractal dimensions in brittle materials |
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