Explanation of red spectral shifts at CdTe grain boundaries
We use cathodoluminescence spectrum imaging to investigate the nanoscale properties of CdTe thin-films for solar cells deposited by close-spaced sublimation. Luminescence emission is detected (bands) at ∼1.32 eV and ∼1.50 eV, which are consistent with Z- and Y-bands. For the grains in the as-deposit...
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Published in: | Applied physics letters Vol. 103; no. 23 |
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Main Authors: | , , , , , |
Format: | Journal Article |
Language: | English |
Published: |
Melville
American Institute of Physics
02-12-2013
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Subjects: | |
Online Access: | Get full text |
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Summary: | We use cathodoluminescence spectrum imaging to investigate the nanoscale properties of CdTe thin-films for solar cells deposited by close-spaced sublimation. Luminescence emission is detected (bands) at ∼1.32 eV and ∼1.50 eV, which are consistent with Z- and Y-bands. For the grains in the as-deposited films, there is a significant redshift in the transition energies near the grain boundaries. The high grain boundary recombination velocity and the donor-acceptor pair (DAP) mechanism of the Z-band transition account for the contrast between grain boundaries and the grain interior. By applying DAP theory, we estimate the concentration of the shallow donor species participating in the Z-band transition to be ∼1017 cm−3. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.4838015 |