Calculation and analysis of Mueller matrix in light scattering detection
A new criterion for target detection and identification is proposed to realize metal/dielectric identification and recognition based on Mueller matrix analysis. By using randomly rough surfaces as targets, numerical calculations are used to prove the robustness and accuracy of the criterion. Moreove...
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| Published in: | Chinese optics letters Vol. 12; no. 9; pp. 87 - 91 |
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| Format: | Journal Article |
| Language: | English |
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10-09-2014
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| Abstract | A new criterion for target detection and identification is proposed to realize metal/dielectric identification and recognition based on Mueller matrix analysis. By using randomly rough surfaces as targets, numerical calculations are used to prove the robustness and accuracy of the criterion. Moreover, to the best of our knowledge, this is the first time to successfully explain the criterion by theoretical analysis. We believe the work orovides an important reference for polarization imaging in laser radar and remote sensing, and so on. |
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| AbstractList | A new criterion for target detection and identification is proposed to realize metal/dielectric identification and recognition based on Mueller matrix analysis. By using randomly rough surfaces as targets, numerical calculations are used to prove the robustness and accuracy of the criterion. Moreover, to the best of our knowledge, this is the first time to successfully explain the criterion by theoretical analysis. We believe the work orovides an important reference for polarization imaging in laser radar and remote sensing, and so on. |
| Author | 闫克丁 王绶玙 江舒 薛亮 宋媛媛 闫振纲 李振华 |
| AuthorAffiliation | Department of Information Physics ＆ Engineering, Nanjing University of Science ＆ Technology, Nanjing 210094, China 704 Institute, China Shipbuilding Industry Corporation, Shanghai 200031, China College of Electronic and Information Engineering, Shanghai University of Electric Power, Shanghai 200090, China China North Vehicle Research Institute, Beijing 100072, China Xi＇an Modern Control Technology Institute, Xi＇an 710065, China |
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| DocumentTitleAlternate | Calculation and analysis of Mueller matrix in light scattering detection |
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| Notes | 31-1890/O3 Keding Yan , Shouyu Wang , Shu Jiang , Liang Xue , Yuanyuan Song , Zhengang Yan , Zhenhua Li （1Department of Information Physics ＆ Engineering, Nanjing University of Science ~： Technology, Nanjing 210094, China ;2.704 Institute, China Shipbuilding Industry Corporation, Shanghai 200031, China 3.College of Electronic and Information Engineering, Shanghai University of Electric Power, Shanghai 200090, China 4.China North Vehicle Research Institute, Belting 100072, China 5Xi＇an Modern Control Technology Institute, Xi＇an 710065, China） A new criterion for target detection and identification is proposed to realize metal/dielectric identification and recognition based on Mueller matrix analysis. By using randomly rough surfaces as targets, numerical calculations are used to prove the robustness and accuracy of the criterion. Moreover, to the best of our knowledge, this is the first time to successfully explain the criterion by theoretical analysis. We believe the work orovides an important reference for polarization imaging in laser radar and remote sensing, and so on. |
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| SubjectTerms | s偏振 光散射检测器 成像激光雷达 数值计算 目标探测 矩阵分析 随机粗糙表面 鲁棒性 |
| Title | Calculation and analysis of Mueller matrix in light scattering detection |
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