Morphological analysis of poly(o-methoxyaniline) thin-films deposited by spin coating technique

Morphological study of conducting polymer thin films obtained by spin coating is reported. Poly(o-methoxyaniline) films were deposited onto glass substrates and analyzed by profilometry and atomic force microscopy (AFM). It is shown that final thickness is correlated by a power law with spin speed w...

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Bibliographic Details
Published in:	Journal of materials science. Materials in electronics Vol. 17; no. 8; pp. 593 - 596
Main Authors:	LIMA, John Paul H, DE ANDRADE, Adnei M
Format:	Journal Article
Language:	English
Published:	Norwell, MA Springer 01-08-2006
Subjects:	Applied sciences Atomic force microscopy Conducting polymers Deposition Electronics Exact sciences and technology Materials Power law Spin coating Surface roughness Thin films Conducting polymers Atomic force microscopy Spin-on coatings Morphological analysis Roughness Glass Polymer films Power law Profilometry Thin film
Online Access:	Get full text
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Summary:	Morphological study of conducting polymer thin films obtained by spin coating is reported. Poly(o-methoxyaniline) films were deposited onto glass substrates and analyzed by profilometry and atomic force microscopy (AFM). It is shown that final thickness is correlated by a power law with spin speed with a solution concentration varying coefficient and that surface roughness decreases with increasing spin speed.
Bibliography:	ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23
ISSN:	0957-4522 1573-482X
DOI:	10.1007/s10854-006-0004-5