Optical spectra of crystalline silicon particles embedded in an amorphous silicon matrix

Deuterated amorphous silicon films deposited by DC reactive magnetron sputtering were measured by Raman spectroscopy and TEM imaging. The films were found to consist of silicon crystallites embedded in an amorphous silicon matrix. The sub-band-gap optical spectra of these films were recorded using p...

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Bibliographic Details

Published in:	Journal of non-crystalline solids Vol. 227; pp. 1040 - 1044
Main Authors:	Kwon, Daewon, Lee, Hao, Cohen, J.David, Jin, Hyun-Chul, Abelson, John R.
Format:	Journal Article
Language:	English
Published:	Elsevier B.V 01-01-1998
Subjects:	a-Si:H c-Si Optical spectra M220 R110 C110 Optical spectra c-Si a-Si:H
Online Access:	Get full text
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