X-ray diffraction microtomography using synchrotron radiation

• Published in: Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 471; no. 1; pp. 75 - 79
• Main Authors: Barroso, R.C., Lopes, R.T., de Jesus, E.F.O., Oliveira, L.F.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 2001
• Subjects: Microtomography; Synchrotron radiation; X-ray diffraction; 87.64.B; X-ray diffraction; Microtomography; 87.59.F; Synchrotron radiation; 07.85.Q
• ISSN: 0168-9002; 1872-9576
• DOI: 10.1016/S0168-9002(01)00918-4

The X-ray diffraction computed tomography technique is based on the interference phenomena of the coherent scatter. For low-momentum transfer, it is most probable that the scattering interaction will be coherent. A selective discrimination of a given element in a scanned specimen can be realized by fixing the Bragg angle which produces an interference peak and then, to carry out the computed tomography in the standard mode. The image reconstructed exalts the presence of this element with respect to other ones in a sample. This work reports the feasibility of a non-destructive synchrotron radiation X-ray diffraction imaging technique. This research was performed at the X-ray Diffraction beam line of the National Synchrotron Light Laboratory (LNLS) in Brazil. The coherent scattering properties of different tissue and bone substitute materials were evaluated. Furthermore, diffraction patterns of some polycrystalline solids were studied due to industrial and environmental human exposure to these metals. The obtained diffraction patterns form the basis of a selective tomography technique. Preliminary images are presented.