Effect of the Boundary Conditions on the High-Frequency Electrical Conductivity of a Thin Conducting Layer in a Longitudinal Magnetic Field

• Published in: Semiconductors (Woodbury, N.Y.) Vol. 54; no. 9; pp. 1039 - 1046
• Main Authors: Kuznetsova, I. V., Savenko, O. V., Kuznetsov, P. A.
• Format: Journal Article
• Language: English
• Published: Moscow Pleiades Publishing 01-09-2020; Springer; Springer Nature B.V
• Subjects: 2020; Boundary conditions; Chemical potential; Coefficients; Comparative analysis; Dielectric films; Diffusion layers; Dimensionless analysis; Electric fields; Electrical resistivity; Electron gas; Magnetic fields; Magnetic induction; Magnetic Materials; Magnetism; Magnetization; Magnetoresistance; Magnetoresistivity; March 10–13; Mathematical analysis; Metallic films; Nizhny Novgorod; Physics; Physics and Astronomy; Thickness; Thin films; Xxiv International Symposium “Nanophysics and Nanoelectronics”; specularity coefficient; thin layer; kinetic equation; electrical conductivity; distribution function
• ISSN: 1063-7826; 1090-6479
• DOI: 10.1134/S106378262009016X

The problem of the high-frequency conductivity of a thin conducting layer in a longitudinal magnetic field is solved using a kinetic approach taking into account the mirror-diffusion boundary conditions. The specularity coefficients of the layer surfaces are assumed to be different. An analytical expression is derived for the dimensionless integrated conductivity as a function of the dimensionless parameters, including the layer thickness, electric-field frequency, magnetic induction, chemical potential, and surface specularity coefficients. The limiting cases of a degenerate and nondegenerate electron gas are considered. A comparative analysis of theoretical calculations with the experimental data is made. A method for determining the specularity coefficients and the carrier mean free path using the longitudinal magnetoresistance of a thin metallic film is demonstrated.