Effect of indium incorporation, stimulated by UHV treatment, on the chemical, optical and electronic properties of ZnO thin film

We show the importance of powerful and complementary analysis techniques XPS (X-rays Photoelectron Spectroscopy), AES (Auger Electron Spectroscopy), and UPS (UV Photoelectron Spectroscopy) associated with PL (Photoluminescence) to investigate the chemical composition, optical emission, and electroni...

Full description

Bibliographic Details

Published in:	Optical materials Vol. 111; p. 110560
Main Authors:	Bedrouni, Mahmoud, Kharroubi, Bachir, Ouerdane, Abdellah, Bouslama, M'hammed, Guezzoul, M'hamed, Caudano, Yves, Bensassi, Kada Belmokhtar, Bousmaha, Mohamed, Bezzerrouk, Mohamed Amine, Mokadem, Azzeddine, Abdelkrim, Mahfoud
Format:	Journal Article
Language:	English
Published:	Elsevier B.V 01-01-2021
Subjects:	IZO thin Film Structural defects and electronic structure UHV treatment XPS UHV treatment XPS PL Structural defects and electronic structure IZO thin Film
Online Access:	Get full text
Tags:	Add Tag No Tags, Be the first to tag this record!