Quadratic Statistical MAX Approximation for Parametric Yield Estimation of Analog/RF Integrated Circuits

In this paper, we propose an efficient numerical algorithm for estimating the parametric yield of analog/RF circuits, considering large-scale process variations. Unlike many traditional approaches that assume normal performance distributions, the proposed approach is particularly developed to handle...

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Bibliographic Details

Published in:	IEEE transactions on computer-aided design of integrated circuits and systems Vol. 27; no. 5; pp. 831 - 843
Main Authors:	Xin Li, Yaping Zhan, Pileggi, L.T.
Format:	Journal Article
Language:	English
Published:	IEEE 01-05-2008
Subjects:	Analog/RF circuits Approximation algorithms Circuits Distributed computing Large-scale systems MAX operator Monte Carlo methods parametric yield Probability distribution Radio frequency Runtime Taylor series Yield estimation
Online Access:	Get full text
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