Efficient Thermal via Planning Approach and Its Application in 3-D Floorplanning

In this paper, we investigate thermal via (T-via) planning during three-dimensional (3-D) floorplanning. First, we consider the temperature constrained T-via planning (TVP) problem on a given 3-D floorplan. Second, we integrate dynamic TVP into 3-D floorplanning process. Our main contribution and re...

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Published in:IEEE transactions on computer-aided design of integrated circuits and systems Vol. 26; no. 4; pp. 645 - 658
Main Authors: Zhuoyuan Li, Hong, X., Qiang Zhou, Shan Zeng, Bian, J., Wenjian Yu, Yang, H.H., Pitchumani, V., Chung-Kuan Cheng
Format: Journal Article
Language:English
Published: New York IEEE 01-04-2007
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Summary:In this paper, we investigate thermal via (T-via) planning during three-dimensional (3-D) floorplanning. First, we consider the temperature constrained T-via planning (TVP) problem on a given 3-D floorplan. Second, we integrate dynamic TVP into 3-D floorplanning process. Our main contribution and results can be summarized as follows. We solve the temperature constrained TVP problem by solving a sequence of simplified interlayer and intralayer TVP subproblems. Each subproblem is formulated as convex programming problem and we derive nearly optimal solution for detailed T-via distribution. Based on the TVP solution, we implement the integrated TVP and 3-D floorplanning algorithm in a two-stage approach. Before floorplanning, blocks are assigned into different layers by solving a sequence of knapsack problems. During floorplanning, T-vias are allocated with white space redistribution to optimize T-via insertion. Experimental results show that our TVP approach can reduce T-vias by 12% compared with a recent published work (J. Cong and Y. Zhang, "Thermal via planning for 3-D ICs," in Proc. Int. Conf. Comput.-Aided Des., Nov. 2005, pp.745-752). Compared with the postfloorplanning optimization approach, integrating TVP into floorplanning process can reduce T-vias by 16% with 21% runtime overhead
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ISSN:0278-0070
1937-4151
DOI:10.1109/TCAD.2006.885831