Non-contact atomic force microscopy of an antiferromagnetic NiO(100) surface using a ferromagnetic tip

Non-contact atomic force microscopy of an antiferromagnetic NiO(100) surface using a ferromagnetic tip

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Bibliographic Details
Published in:Applied physics. A, Materials science & processing Vol. 72; no. S1; pp. S23 - S26
Main Authors: Hosoi, H., Kimura, M., Hayakawa, K., Sueoka, K., Mukasa, K.
Format: Journal Article
Language:English
Published: 01-03-2001
Online Access:Get full text
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Description
ISSN:0947-8396
1432-0630
DOI:10.1007/s003390100722