Imaging polymer interfaces at high resolution with electron microscopy: Perspective, challenges, and opportunities

• Published in: Journal of polymer science (2020) Vol. 62; no. 16; pp. 3681 - 3686
• Main Author: Ribbe, Alexander E.
• Format: Journal Article
• Language: English
• Published: Hoboken, USA John Wiley & Sons, Inc 15-08-2024; Wiley Subscription Services, Inc
• Subjects: Chemical damage; Chemical properties; Electron beams; electron tomography; energy‐filtered; Hard materials; Image resolution; polymer morphology; Polymers; Thickness; Transmission electron microscopy; ultramicrotomy
• ISSN: 2642-4150; 2642-4169
• DOI: 10.1002/pol.20230647

Transmission electron microscopy (TEM) has evolved into a powerful characterization tool that allows visualization of materials with finer resolution than any other type of microscope in existence. While numerous areas of the physical and biologically sciences and engineering benefit tremendously from TEM and its analytical features, the highest resolution can only be achieved if a sample fulfills certain requirements, including an optimal thickness as well as a sufficiently long e‐beam stability. At a fundamental level, the physical and chemical properties of organic polymers are generally problematic in conjunction with TEM, as they experience damage from the electron beam more readily than their hard materials counterparts. However, progress in polymer characterization using TEM has evolved considerably and the polymer community stands to benefit greatly from continued growth going forward.