MeV Au2+ ions induced surface patterning in silica

► Irradiation of 1.8MeV Au2+ ions at normal incidence on silica samples under room temperature (doses: from 5×1016ions/cm2 to 2×1017ions/cm2). ► Formation of periodic surface pattern with a wavelength of 1.35μm only on samples irradiated to a dose of 1×1017ions/cm2 and more. ► Surface segregation of...

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Bibliographic Details
Published in:	Applied surface science Vol. 258; no. 9; pp. 4156 - 4160
Main Authors:	Santhana Raman, P., Nair, K.G.M., Kamruddin, M., Tyagi, A.K., Rath, A., Satyam, P.V., Panigrahi, B.K., Ravichandran, V.
Format:	Journal Article
Language:	English
Published:	Amsterdam Elsevier B.V 15-02-2012 Elsevier
Subjects:	Composition; defects and impurities Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science; rheology Exact sciences and technology Formations Gold Incidence Ion irradiation Irradiation Materials science MeV ions Patterning Physics Segregations Silica Silicon dioxide Solid surfaces and solid-solid interfaces Surface cleaning, etching, patterning Surface pattern Surface treatments Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) Wavelengths MeV ions Surface pattern Ion irradiation Silica Patterning Inorganic compounds Physical radiation effects Amorphous state Surface stresses Ion beams Surface structure Silicon oxides Transition elements Gold ions
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