Structural, ferroelectric and magnetic properties of lead ferrite (Pb2Fe2O5) thin films synthesized by reactive magnetron deposition

•Lead ferrite thin films were synthesized using reactive magnetron deposition.•Lead ferrite samples demonstrate well ferroelectric and ferromagnetic properties.•Ferroelectric properties depend on synthesis temperature and ratio of lead and ferrum oxides.•Ferromagnetic properties depend on synthesis...

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Published in:Thin solid films Vol. 708; p. 138124
Main Authors: Beklešovas, Benas, Stankus, Vytautas, Link, Joosep, Stern, Raivo
Format: Journal Article
Language:English
Published: Elsevier B.V 31-08-2020
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Abstract •Lead ferrite thin films were synthesized using reactive magnetron deposition.•Lead ferrite samples demonstrate well ferroelectric and ferromagnetic properties.•Ferroelectric properties depend on synthesis temperature and ratio of lead and ferrum oxides.•Ferromagnetic properties depend on synthesis temperature. Lead ferrite (Pb2Fe2O5) thin films were deposited by reactive magnetron sputtering in the (500 - 600)°C temperature range. At room temperature, thin films exhibited remnant polarization of ~60 µC/cm2 and EC ~ 90 kV/cm. With the increase of synthesis temperature, ferroelectric properties deteriorate and formed capacitors become lossy. X-ray diffraction pattern demonstrated formation of lead ferrite phase, although lead and iron oxides could not be avoided. It was determined by atomic force microscopy (AFM), that with the increase of temperature, average surface roughness decreases from 25.9 nm to 2.7 nm, possibly due to the surface diffusion. Images of scanning electron microscopy complement AFM data where smoother surfaces are visible. Measured temperature dependences of dielectric permittivity indicated Curie temperature at 783 K. Magnetic susceptibility measurement confirmed Neel magnetic ordering temperature around 540 K.
AbstractList •Lead ferrite thin films were synthesized using reactive magnetron deposition.•Lead ferrite samples demonstrate well ferroelectric and ferromagnetic properties.•Ferroelectric properties depend on synthesis temperature and ratio of lead and ferrum oxides.•Ferromagnetic properties depend on synthesis temperature. Lead ferrite (Pb2Fe2O5) thin films were deposited by reactive magnetron sputtering in the (500 - 600)°C temperature range. At room temperature, thin films exhibited remnant polarization of ~60 µC/cm2 and EC ~ 90 kV/cm. With the increase of synthesis temperature, ferroelectric properties deteriorate and formed capacitors become lossy. X-ray diffraction pattern demonstrated formation of lead ferrite phase, although lead and iron oxides could not be avoided. It was determined by atomic force microscopy (AFM), that with the increase of temperature, average surface roughness decreases from 25.9 nm to 2.7 nm, possibly due to the surface diffusion. Images of scanning electron microscopy complement AFM data where smoother surfaces are visible. Measured temperature dependences of dielectric permittivity indicated Curie temperature at 783 K. Magnetic susceptibility measurement confirmed Neel magnetic ordering temperature around 540 K.
ArticleNumber 138124
Author Stankus, Vytautas
Stern, Raivo
Beklešovas, Benas
Link, Joosep
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  surname: Stern
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CitedBy_id crossref_primary_10_1149_2162_8777_ad0324
crossref_primary_10_4028_www_scientific_net_MSF_1028_77
crossref_primary_10_1016_j_matlet_2024_136849
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Keywords Thin films
Lead Ferrite
Magnetron sputtering
Ferroelectrics
Multiferroics
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Snippet •Lead ferrite thin films were synthesized using reactive magnetron deposition.•Lead ferrite samples demonstrate well ferroelectric and ferromagnetic...
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StartPage 138124
SubjectTerms Ferroelectrics
Lead Ferrite
Magnetron sputtering
Multiferroics
Thin films
Title Structural, ferroelectric and magnetic properties of lead ferrite (Pb2Fe2O5) thin films synthesized by reactive magnetron deposition
URI https://dx.doi.org/10.1016/j.tsf.2020.138124
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