Structural, ferroelectric and magnetic properties of lead ferrite (Pb2Fe2O5) thin films synthesized by reactive magnetron deposition

• Published in: Thin solid films Vol. 708; p. 138124
• Main Authors: Beklešovas, Benas, Stankus, Vytautas, Link, Joosep, Stern, Raivo
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 31-08-2020
• Subjects: Ferroelectrics; Lead Ferrite; Magnetron sputtering; Multiferroics; Thin films; Thin films; Lead Ferrite; Magnetron sputtering; Ferroelectrics; Multiferroics
• ISSN: 0040-6090; 1879-2731
• DOI: 10.1016/j.tsf.2020.138124

•Lead ferrite thin films were synthesized using reactive magnetron deposition.•Lead ferrite samples demonstrate well ferroelectric and ferromagnetic properties.•Ferroelectric properties depend on synthesis temperature and ratio of lead and ferrum oxides.•Ferromagnetic properties depend on synthesis temperature.
Lead ferrite (Pb2Fe2O5) thin films were deposited by reactive magnetron sputtering in the (500 - 600)°C temperature range. At room temperature, thin films exhibited remnant polarization of ~60 µC/cm2 and EC ~ 90 kV/cm. With the increase of synthesis temperature, ferroelectric properties deteriorate and formed capacitors become lossy. X-ray diffraction pattern demonstrated formation of lead ferrite phase, although lead and iron oxides could not be avoided. It was determined by atomic force microscopy (AFM), that with the increase of temperature, average surface roughness decreases from 25.9 nm to 2.7 nm, possibly due to the surface diffusion. Images of scanning electron microscopy complement AFM data where smoother surfaces are visible. Measured temperature dependences of dielectric permittivity indicated Curie temperature at 783 K. Magnetic susceptibility measurement confirmed Neel magnetic ordering temperature around 540 K.