Out-of-plane tilted Josephson junctions of bi-epitaxial YBa2Cu3Ox thin films on tilted-axes NdGaO3 substrates with CeO2 seeding layer

• Published in: Physica. C, Superconductivity Vol. 435; no. 1-2; pp. 23 - 26
• Main Authors: Mozhaev, Peter B., Mozhaeva, Julia E., Bdikin, Igor K., Kotelyanskii, Iosif M., Luzanov, Valery A., Zybtsev, Sergey G., Hansen, Jørn Bindslev, Jacobsen, Claus S.
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 15-03-2006; Elsevier Science
• Subjects: Bi-epitaxial -tilt Josephson junctions; Textured growth on a seeding layer; 74.78.Bz; Textured growth on a seeding layer; Bi-epitaxial -tilt Josephson junctions; 74.50.+r
• ISSN: 0921-4534; 1873-2143
• DOI: 10.1016/j.physc.2006.01.011

Bi-epitaxial heterostructures YBa2Cu3Ox(YBCO)/CeO2/NdGaO3 were prepared on tilted-axes NdGaO3 substrates using laser ablation technique. The heterostructures were patterned for electrical measurements using photolithography and ion-beam milling. Electrical anisotropy of the YBCO film was tested on the ion-beam etched surface. Bi-epitaxial junctions with four different orientations of the bi-epitaxial border were fabricated and studied. The measured IV curves showed flux–flow behavior with critical current density 2.5×104A/cm2 for the twist-type junctions and 1.5×103A/cm2 for [100]-tilt type junctions.