Design and Evaluation of Nonlinear Verification Device for Nonlinear Vector Network Analyzers

A simple diode-based nonlinear verification device (NVD) design for nonlinear vector network analyzers is presented together with an improved figure of merit (FOM) parameter that is insensitive to impedance match and isolates variation of the device's nonlinear parameters. The stability over 84...

Full description

Saved in:

Bibliographic Details
Published in:	IEEE transactions on microwave theory and techniques Vol. 66; no. 2; pp. 1121 - 1130
Main Authors:	Rajabi, Mohammad, Humphreys, David A., Avolio, Gustavo, Barmuta, Pawel, Lukasik, Konstanty R., Nielsen, Troels S., Schreurs, Dominique M. M.-P.
Format:	Journal Article
Language:	English
Published:	New York IEEE 01-02-2018 The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:	Analyzers Calibration Design analysis Design engineering Figure of merit Harmonic analysis Impedance Instrumentation and measurement measurement uncertainty microwave integrated circuits Nonlinear analysis nonlinear circuits nonlinear network analysis Semiconductor device measurement semiconductor diodes Sensitivity Transmission line measurements Uncertainty
Online Access:	Get full text
Tags:	Add Tag No Tags, Be the first to tag this record!

Abstract	A simple diode-based nonlinear verification device (NVD) design for nonlinear vector network analyzers is presented together with an improved figure of merit (FOM) parameter that is insensitive to impedance match and isolates variation of the device's nonlinear parameters. The stability over 84 h and load-pull performance of this new design have been evaluated.
AbstractList	A simple diode-based nonlinear verification device (NVD) design for nonlinear vector network analyzers is presented together with an improved figure of merit (FOM) parameter that is insensitive to impedance match and isolates variation of the device's nonlinear parameters. The stability over 84 h and load-pull performance of this new design have been evaluated.
Author	Humphreys, David A. Avolio, Gustavo Lukasik, Konstanty R. Schreurs, Dominique M. M.-P. Barmuta, Pawel Rajabi, Mohammad Nielsen, Troels S.
Author_xml	– sequence: 1 givenname: Mohammad orcidid: 0000-0003-4694-4421 surname: Rajabi fullname: Rajabi, Mohammad email: mohammad.rajabi@kuleuven.be organization: Department of Electrical Engineering, KU Leuven, Leuven, Belgium – sequence: 2 givenname: David A. orcidid: 0000-0001-7720-6742 surname: Humphreys fullname: Humphreys, David A. email: david.humphreys@npl.co.uk organization: National Physical Laboratory, Teddington, U.K – sequence: 3 givenname: Gustavo orcidid: 0000-0002-8910-1638 surname: Avolio fullname: Avolio, Gustavo organization: Department of Electrical Engineering, KU Leuven, Leuven, Belgium – sequence: 4 givenname: Pawel orcidid: 0000-0003-4525-0620 surname: Barmuta fullname: Barmuta, Pawel organization: Department of Electrical Engineering, KU Leuven, Leuven, Belgium – sequence: 5 givenname: Konstanty R. surname: Lukasik fullname: Lukasik, Konstanty R. organization: Department of Electrical Engineering, KU Leuven, Leuven, Belgium – sequence: 6 givenname: Troels S. orcidid: 0000-0001-7187-5371 surname: Nielsen fullname: Nielsen, Troels S. organization: Keysight Technologies, Aalborg East, Denmark – sequence: 7 givenname: Dominique M. M.-P. orcidid: 0000-0002-4018-7936 surname: Schreurs fullname: Schreurs, Dominique M. M.-P. organization: Department of Electrical Engineering, KU Leuven, Leuven, Belgium
BookMark	eNpVkE1LAzEQhoNUsK3-APGy4HnrZHfzdSxt_YCql9WbhDSbSGrd1GRbqb_eXbYInoaZed5heEZoUPvaIHSJYYIxiJvysSwnGWA2yRjNKBEnaIgJYamgDAZoCIB5KgoOZ2gU47ptCwJ8iN7mJrr3OlF1lSz2arNTjfN14m3y5OuNq40KyasJzjrdb-Zm77RJrA__CN10A9N8-_CRTGu1OfyYEM_RqVWbaC6OdYxebhfl7D5dPt89zKbLVGecN6khdEVtoaxgJOcWawDBC7BW5YyxolIst5XlYBVVNGPEEGa1WmmaV5nOicjH6Lq_uw3-a2diI9d-F9ovosRCFAWFjOGWwj2lg48xGCu3wX2qcJAYZGdRdhZlZ1EeLbaZqz7jjDF_PAeRM4D8F8sLcNE
CODEN	IETMAB
Cites_doi	10.1109/MMM.2012.2226640 10.1109/MWSYM.2007.380344 10.1109/LMWC.2009.2038618 10.1109/ARFTG.2015.7162895 10.1109/MW-M.2006.250314 10.1109/MMM.2015.2499043 10.1201/9781420006704 10.1049/el:19921372 10.1109/MMM.2008.919925 10.1109/MMW.2006.1638289 10.1109/MMM.2009.934518 10.1109/CPEM.2016.7540467 10.1109/MMM.2013.2288839 10.1109/CPEM.2014.6898577 10.1109/ARFTGF.2003.1459783 10.1109/MMM.2012.2227191 10.1109/ARFTG.2014.7013414 10.1109/TMTT.2015.2432765 10.1109/MMM.2013.2280311
ContentType	Journal Article
Copyright	Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2018
Copyright_xml	– notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2018
DBID	97E RIA RIE AAYXX CITATION 7SP 8FD L7M
DOI	10.1109/TMTT.2017.2762659
DatabaseName	IEEE All-Society Periodicals Package (ASPP) 2005-present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Electronic Library Online CrossRef Electronics & Communications Abstracts Technology Research Database Advanced Technologies Database with Aerospace
DatabaseTitle	CrossRef Technology Research Database Advanced Technologies Database with Aerospace Electronics & Communications Abstracts
DatabaseTitleList	Technology Research Database
Database_xml	– sequence: 1 dbid: RIE name: IEEE Electronic Library Online url: http://ieeexplore.ieee.org/Xplore/DynWel.jsp sourceTypes: Publisher
DeliveryMethod	fulltext_linktorsrc
Discipline	Engineering
EISSN	1557-9670
EndPage	1130
ExternalDocumentID	10_1109_TMTT_2017_2762659 8093700
Genre	orig-research
GrantInformation_xml	– fundername: EMRP joint research project “SIB62 HF Circuits,” – fundername: Hercules – fundername: European Union – fundername: FWO – fundername: EMRP participating countries within EURAMET
GroupedDBID	-~X .GJ 0R~ 29I 3EH 4.4 5GY 5VS 66. 6IK 85S 97E AAJGR AASAJ ABQJQ ABVLG ACGFO ACGFS ACIWK ACNCT AENEX AETIX AI. AIBXA AKJIK ALLEH ALMA_UNASSIGNED_HOLDINGS ATWAV B-7 BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD F5P HZ~ H~9 IAAWW IBMZZ ICLAB IDIHD IFIPE IFJZH IPLJI JAVBF LAI M43 O9- OCL P2P RIA RIE RIG RNS RXW TAE TAF TN5 VH1 VJK VOH XFK AAYXX CITATION 7SP 8FD L7M
ID	FETCH-LOGICAL-c288t-e56b6f4af97538f1c009840ffa37774da73fdf80fa6a6275e57fcabc63d2c3593
IEDL.DBID	RIE
ISSN	0018-9480
IngestDate	Thu Oct 10 18:02:42 EDT 2024 Fri Aug 23 01:52:07 EDT 2024 Wed Jun 26 19:18:22 EDT 2024
IsDoiOpenAccess	false
IsOpenAccess	true
IsPeerReviewed	true
IsScholarly	true
Issue	2
Language	English
LinkModel	DirectLink
MergedId	FETCHMERGED-LOGICAL-c288t-e56b6f4af97538f1c009840ffa37774da73fdf80fa6a6275e57fcabc63d2c3593
ORCID	0000-0002-4018-7936 0000-0003-4694-4421 0000-0002-8910-1638 0000-0003-4525-0620 0000-0001-7187-5371 0000-0001-7720-6742
OpenAccessLink	https://research-information.bris.ac.uk/ws/files/149571209/David_Humphreys_Design_and_Evaluation_of_Nonlinear_Verification_Device_for_Nonlinear_Vector_Network_Analyzers.pdf
PQID	1994460271
PQPubID	106035
PageCount	10
ParticipantIDs	proquest_journals_1994460271 crossref_primary_10_1109_TMTT_2017_2762659 ieee_primary_8093700
PublicationCentury	2000
PublicationDate	2018-02-01
PublicationDateYYYYMMDD	2018-02-01
PublicationDate_xml	– month: 02 year: 2018 text: 2018-02-01 day: 01
PublicationDecade	2010
PublicationPlace	New York
PublicationPlace_xml	– name: New York
PublicationTitle	IEEE transactions on microwave theory and techniques
PublicationTitleAbbrev	TMTT
PublicationYear	2018
Publisher	IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml	– name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
References	ref12 humphreys (ref24) 2005 ref15 ref14 ref11 golio (ref17) 2007 ref22 ref10 rolain (ref13) 2007 ref2 ref1 doo (ref23) 2005 ref16 ref19 ref18 ref8 ref7 ref9 ref4 yichi (ref21) 2012 ref3 ref6 ehlers (ref20) 1986; 37 ref5
References_xml	– ident: ref5 doi: 10.1109/MMM.2012.2226640 – start-page: 1 year: 2005 ident: ref24 article-title: Compensation of sampling oscilloscope trigger jitter by an In-phase and quadrature referencing technique publication-title: Proc ARMMS Conf contributor: fullname: humphreys – ident: ref14 doi: 10.1109/MWSYM.2007.380344 – ident: ref9 doi: 10.1109/LMWC.2009.2038618 – ident: ref7 doi: 10.1109/ARFTG.2015.7162895 – ident: ref2 doi: 10.1109/MW-M.2006.250314 – volume: 37 start-page: 10 year: 1986 ident: ref20 article-title: Extending millimeter-wave diode operation to 110 GHz publication-title: Hewlett-Packard J contributor: fullname: ehlers – ident: ref10 doi: 10.1109/MMM.2015.2499043 – year: 2007 ident: ref17 publication-title: RF and Microwave Circuits Measurements and Modeling The RF and Microwave Handbook doi: 10.1201/9781420006704 contributor: fullname: golio – ident: ref18 doi: 10.1049/el:19921372 – ident: ref4 doi: 10.1109/MMM.2008.919925 – ident: ref12 doi: 10.1109/MMW.2006.1638289 – ident: ref1 doi: 10.1109/MMM.2009.934518 – start-page: 108 year: 2012 ident: ref21 article-title: An NVNA poly-harmonic inter-modulation phase reference based on SRD comb generator and multi-tone stimulus publication-title: Proc Conf Precis Electromagn Meas (CPEM) contributor: fullname: yichi – ident: ref11 doi: 10.1109/CPEM.2016.7540467 – ident: ref6 doi: 10.1109/MMM.2013.2288839 – ident: ref22 doi: 10.1109/CPEM.2014.6898577 – ident: ref15 doi: 10.1109/ARFTGF.2003.1459783 – ident: ref19 doi: 10.1109/MMM.2012.2227191 – start-page: 7 year: 2005 ident: ref23 article-title: Pulsed-IV pulsed-RF measurements using a large signal network analyzer publication-title: 65th ARFTG Conf Dig contributor: fullname: doo – start-page: 82 year: 2007 ident: ref13 article-title: A round-robin benchmark for the large signal network analyzer publication-title: 26th Benelux Meeting on Systems and Control contributor: fullname: rolain – ident: ref16 doi: 10.1109/ARFTG.2014.7013414 – ident: ref3 doi: 10.1109/TMTT.2015.2432765 – ident: ref8 doi: 10.1109/MMM.2013.2280311
SSID	ssj0014508
Score	2.2995052
Snippet	A simple diode-based nonlinear verification device (NVD) design for nonlinear vector network analyzers is presented together with an improved figure of merit...
SourceID	proquest crossref ieee
SourceType	Aggregation Database Publisher
StartPage	1121
SubjectTerms	Analyzers Calibration Design analysis Design engineering Figure of merit Harmonic analysis Impedance Instrumentation and measurement measurement uncertainty microwave integrated circuits Nonlinear analysis nonlinear circuits nonlinear network analysis Semiconductor device measurement semiconductor diodes Sensitivity Transmission line measurements Uncertainty
Title	Design and Evaluation of Nonlinear Verification Device for Nonlinear Vector Network Analyzers
URI	https://ieeexplore.ieee.org/document/8093700 https://www.proquest.com/docview/1994460271
Volume	66
hasFullText	1
inHoldings	1
isFullTextHit
isPrint
link	http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV07T8MwED7RTjDwKohCQR6YEGmdxImdEdFWXehCQCwocvwYU9TH0l-Pz0mjIljYMlyi6D77fM_PAPdcU5nFTAQyEjJgEVNB6aKOgDvfObUyVqXA4eTZK59_iPEEaXIe21kYY4xvPjNDfPS1fL1QG0yVjYQLvzl1AXqHZ6Ke1WorBiyhjdV1G5iJXQUzpNkof8lzbOLiw8ht_RRpSffOIH-pyi9L7I-X6cn_fuwUjhs3kjzVuJ_BganO4WiPXLAHn2PfnEFkpcmk5fQmC0vmNT2GXJJ3J2ubrB0ZG7QaxHmxPyQwq0_mdbc48RwmW-cyXsDbdJI_z4LmMoVARUKsA5OkZWqZtDhJK2yokEmUUevw4M4F1JLHVltBrUwlMhebhFslS5XGOlJxksWX0K0WlbkCIpV2n9BZ6KJyJkxYJqWOs4RSGZVI1tOHh516i6-aM6PwsQbNCsSiQCyKBos-9FCfrWCjyj4MdoAUza5aFchjzFIXSIfXf791A4cRLgDfVT2A7nq5MbfQWenNnV8t3yxVvYY
link.rule.ids	315,782,786,798,27933,27934,54767
linkProvider	IEEE
linkToHtml	http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV07T8MwELagDMDAqyAKBTwwIdI6iRM7I6KtimizEBALihw_xhT1sfDr8TlpVAQLW4ZLFN1nn-_5GaFbpohIQso9EXDh0YBKr7BRh8es7xwbEcqCw3Dy-IWl73wwBJqc-2YWRmvtms90Dx5dLV_N5ApSZX1uw29GbIC-E1EWs2paq6kZ0IjUdtduYcrXNUyfJP1smmXQxsV6gd38MRCTbpxC7lqVX7bYHTCjw__92hE6qB1J_FAhf4y2dHmC9jfoBdvoY-DaM7AoFR42rN54ZnBaEWSIOX6zsqbO2-GBBruBrR_7QwLy-jit-sWxYzH5sk7jKXodDbPHsVdfp-DJgPOlp6O4iA0VBmZpufElcIlSYiwizDqBSrDQKMOJEbEA7mIdMSNFIeNQBTKMkvAMtcpZqc8RFlLZT6jEt3E55dovokKFSUSICAqg6-mgu7V688-KNSN30QZJcsAiByzyGosOaoM-G8FalR3UXQOS1_tqkQOTMY1tKO1f_P3WDdodZ9NJPnlKny_RXgCLwfVYd1FrOV_pK7S9UKtrt3K-AVDtwNc
openUrl	ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Design+and+Evaluation+of+Nonlinear+Verification+Device+for+Nonlinear+Vector+Network+Analyzers&rft.jtitle=IEEE+transactions+on+microwave+theory+and+techniques&rft.au=Rajabi%2C+Mohammad&rft.au=Humphreys%2C+David+A.&rft.au=Avolio%2C+Gustavo&rft.au=Barmuta%2C+Pawel&rft.date=2018-02-01&rft.pub=IEEE&rft.issn=0018-9480&rft.eissn=1557-9670&rft.volume=66&rft.issue=2&rft.spage=1121&rft.epage=1130&rft_id=info:doi/10.1109%2FTMTT.2017.2762659&rft.externalDocID=8093700
thumbnail_l	http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9480&client=summon
thumbnail_m	http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9480&client=summon
thumbnail_s	http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9480&client=summon