Refined Structure of Langmuir Lysozyme Films on Single-Crystal Silicon Wafers According to X-Ray Reflectivity Data

Thin lysozyme films on single-crystal silicon wafers have been studied by X-ray reflectivity. The films have been formed using the modified Langmuir–Schaefer method with potassium chloride as a precipitant. A layered model of the structure of the investigated films based on the calculated electron d...

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Bibliographic Details
Published in:	Crystallography reports Vol. 65; no. 6; pp. 827 - 831
Main Authors:	Folomeshkin, M. S., Boikova, A. S., Volkovsky, Yu. A., Marchenkova, M. A., Prosekov, P. A., Seregin, A. Yu
Format:	Journal Article
Language:	English
Published:	Moscow Pleiades Publishing 01-11-2020
Subjects:	Crystallography and Scattering Methods Diffraction and Scattering of Ionizing Radiations Physics Physics and Astronomy
Online Access:	Get full text
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Summary:	Thin lysozyme films on single-crystal silicon wafers have been studied by X-ray reflectivity. The films have been formed using the modified Langmuir–Schaefer method with potassium chloride as a precipitant. A layered model of the structure of the investigated films based on the calculated electron density distribution in a lysozyme molecule is proposed. It is shown that the model obtained in this way allows one to refine the structure of investigated films when processing reflectivity data.
ISSN:	1063-7745 1562-689X
DOI:	10.1134/S1063774520060152