Fluctuations of local optical anisotropy of island films

A method for the determination of the island film structure parameters by measuring fluctuations of optical characteristics of small areas of the film is proposed and implemented. The extinction fluctuations of the laser beam are measured experimentally in a focal spot, in which the polarization of...

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Bibliographic Details
Published in:Optics and spectroscopy Vol. 104; no. 6; pp. 866 - 869
Main Authors: Vartanyan, T. A., Leonov, N. B., Logunov, A. E., Papko, A. V., Przhibel’skiĭ, S. G., Khromov, V. V.
Format: Journal Article
Language:English
Published: Dordrecht SP MAIK Nauka/Interperiodica 01-06-2008
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Summary:A method for the determination of the island film structure parameters by measuring fluctuations of optical characteristics of small areas of the film is proposed and implemented. The extinction fluctuations of the laser beam are measured experimentally in a focal spot, in which the polarization of radiation is modulated in time and which is movable over the film. From the optical data thus obtained, the optical absorption anisotropy of the nanometer-size islands of the film is evaluated. It is shown that this characteristic has a considerable frequency dispersion in the region of plasmon resonances of the nanoparticles.
ISSN:0030-400X
1562-6911
DOI:10.1134/S0030400X08060118