Molecular film growth monitoring via reflection microscopy on periodically patterned substrates
An optical method is presented for in the situ monitoring of biomolecular films via reflection microscopy on patterned substrates. The method is based on measuring the reflection coefficient of a composite consisting of a substrate, a patterned optical layer, the thin film to be monitored and the co...
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Published in: | Optics express Vol. 21; no. 4; pp. 4215 - 4227 |
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Main Authors: | , , |
Format: | Journal Article |
Language: | English |
Published: |
United States
25-02-2013
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Subjects: | |
Online Access: | Get full text |
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