Molecular film growth monitoring via reflection microscopy on periodically patterned substrates

An optical method is presented for in the situ monitoring of biomolecular films via reflection microscopy on patterned substrates. The method is based on measuring the reflection coefficient of a composite consisting of a substrate, a patterned optical layer, the thin film to be monitored and the co...

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Bibliographic Details
Published in:Optics express Vol. 21; no. 4; pp. 4215 - 4227
Main Authors: Archontas, I, Salapatas, A, Misiakos, K
Format: Journal Article
Language:English
Published: United States 25-02-2013
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