Confocal surface acoustic wave microscopy

Confocal surface acoustic wave microscopy

When the scanning acoustic microscope is used in a defocussed mode to measure surface acoustic wave properties, circular surface wave fronts are generated on the specimen which propagate to a diffraction-limited focus. Thus, high resolution surface wave images are simply formed and a wide range of e...

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Bibliographic Details
Published in:Applied physics letters Vol. 42; no. 5; pp. 411 - 413
Main Authors: Smith, I R, Wickramasinghe, H K, Farnell, G W, Jen, C K
Format: Journal Article
Language:English
Published: 01-01-1983
Online Access:Get full text
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Summary:When the scanning acoustic microscope is used in a defocussed mode to measure surface acoustic wave properties, circular surface wave fronts are generated on the specimen which propagate to a diffraction-limited focus. Thus, high resolution surface wave images are simply formed and a wide range of established nondestructive testing techniques become available to the acoustic microscope. Images obtained in the reflection mode are presented which demonstrate the unexpectedly high spatial resolution.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
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content type line 23
ISSN:0003-6951
1077-3118
DOI:10.1063/1.93958