In-plane manipulation of quantum dots in high quality laterally contacted micropillar cavities

• Published in: Applied physics letters Vol. 98; no. 19; pp. 191111 - 191111-3
• Main Authors: Beetz, J., Kistner, C., Lermer, M., Schneider, C., Reitzenstein, S., Höfling, S., Kamp, M., Forchel, A.
• Format: Journal Article
• Language: English
• Published: American Institute of Physics 09-05-2011
• ISSN: 0003-6951; 1077-3118
• DOI: 10.1063/1.3589975

We report on the realization and study of laterally contacted quantum dot (QD)-micropillars. The lateral contacts are formed by ion beam induced deposition and allow for the application of in-plane electric fields. The processing was optimized to preserve high optical quality of the QD-micropillars and to minimize detrimental leakage currents while providing a good electrical control of the QD properties. Under variation of the applied voltage we are able to Stark-tune the emission energy of the QDs up to 0.12 meV and to reduce their fine structure splitting by up to a factor of 5.