Experimental estimation of the surface roughness distribution parameters in nanochannels

A statistical model of surface roughness is developed to calculate the molecular flows in nanosystems. In this model, surface asperities are represented by a set of flat microareas connected by edges with each other and having normals that differ from the normal to the mean level. A Solver PRO-M ato...

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Published in:Technical physics Vol. 56; no. 12; pp. 1802 - 1806
Main Authors: Memnonov, V. P., Ul’yanov, P. G.
Format: Journal Article
Language:English
Published: Dordrecht SP MAIK Nauka/Interperiodica 01-12-2011
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Abstract A statistical model of surface roughness is developed to calculate the molecular flows in nanosystems. In this model, surface asperities are represented by a set of flat microareas connected by edges with each other and having normals that differ from the normal to the mean level. A Solver PRO-M atomic force microscope is used to measure the following two parameters of the microscopic roughness of a hard disk: the slope along a scan line and the asperity height. A large experimental sample from the measured values of these parameters is used to obtain a distribution function density for the angle of inclination and conditional distributions (with parameters dependent on this angle) for the asperity height and the area of the triangle formed by the height and the sides of the angle. The latter conditional exponential distribution turns out to be more convenient for calculating random quantities. The results can be employed to simulate boundary conditions when calculating molecular flows by statistical Monte Carlo methods and to estimate the properties of new materials for protective surface coatings in the nanosystems containing gas flows.
AbstractList A statistical model of surface roughness is developed to calculate the molecular flows in nanosystems. In this model, surface asperities are represented by a set of flat microareas connected by edges with each other and having normals that differ from the normal to the mean level. A Solver PRO-M atomic force microscope is used to measure the following two parameters of the microscopic roughness of a hard disk: the slope along a scan line and the asperity height. A large experimental sample from the measured values of these parameters is used to obtain a distribution function density for the angle of inclination and conditional distributions (with parameters dependent on this angle) for the asperity height and the area of the triangle formed by the height and the sides of the angle. The latter conditional exponential distribution turns out to be more convenient for calculating random quantities. The results can be employed to simulate boundary conditions when calculating molecular flows by statistical Monte Carlo methods and to estimate the properties of new materials for protective surface coatings in the nanosystems containing gas flows.
A statistical model of surface roughness is developed to calculate the molecular flows in nanosystems. In this model, surface asperities are represented by a set of flat microareas connected by edges with each other and having normals that differ from the normal to the mean level. A Solver PRO-M atomic force microscope is used to measure the following two parameters of the microscopic roughness of a hard disk: the slope along a scan line and the asperity height. A large experimental sample from the measured values of these parameters is used to obtain a distribution function density for the angle of inclination and conditional distributions (with parameters dependent on this angle) for the asperity height and the area of the triangle formed by the height and the sides of the angle. The latter conditional exponential distribution turns out to be more convenient for calculating random quantities. The results can be employed to simulate boundary conditions when calculating molecular flows by statistical Monte Carlo methods and to estimate the properties of new materials for protective surface coatings in the nanosystems containing gas flows. DOI: 10.1134/S1063784211120127
Audience Academic
Author Memnonov, V. P.
Ul’yanov, P. G.
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Cites_doi 10.1016/0042-207X(96)00069-3
10.1098/rsta.2000.0532
10.1016/j.ultramic.2004.08.005
10.1116/1.1603278
10.1093/oso/9780198561958.001.0001
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Issue 12
Keywords Roughness Parameter
Asperity Height
Direct Simula Tion Monte Carlo
Atomic Force Microscopy
Hard Disk
Language English
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References J.-Z. Jiand, C. Shen, and J. Fan, in Proceedings of the 24th International Symposium on Rarefied Gas Dynamics, Monopoli, Bari, 2004, pp. 180–185; AIP Conf. Proc. 762, 692 (2005).
M. L. Zanaveskin, I. S. Zanaveskina, B. S. Rashchin, V. E. Asadchikov, V. V. Azarova, Yu. V. Grishchenko, and A. L. Tolstikhina, Vestn. Mosk. Univ., Ser. 3: Fiz. Astron., No. 8, 80 (2006).
CowbornR. P.Philos. Trans. R. Soc. London, Ser. A200035828110.1098/rsta.2000.05322000RSPTA.358..281C
KhusuA. P.VittenbergYu. R.Pal’movV. A.Surface Roughness: Probability-Theoretical Approach1975MoscowNauka
MemnonovV. P.ChetverushkinB.EcerA.Parallel Computational Fluid Dynamics-Advance Numerical Methods: Software and Applications2004AmsterdamElsevier8996
NovikovYu. A.Tr. Inst. Obshch. Fiz. im. Prokhorova200662121
UkhovA. I.PorodnovB. T.BorisovS. F.Prikl. Mekh. Tekh. Fiz.20095020
DedkovG. V.KanametovA. A.DedkovaE. G.Zh. Tekh. Fiz.2009791279[Tech. Phys. 54, 1801 (2009)]
KlapetekP.OhlidalI.BilekJ.Ultramicroscopy20041025110.1016/j.ultramic.2004.08.005
J.-S. Wu and K.-C. Tseng, in Proceedings of the 22nd International Symposium on Rarefied Gas Dynamics, Sydney, 2000, pp. 486–493; AIP Conf. Proc. 585, 772 (2001).
SavadaT.HorieB. Y.SugiyamaW.Vacuum19964779510.1016/0042-207X(96)00069-3
KlapetekP.OhlidalI.Acta Phys. Slovaca200555295
LiD.YipW. Ch.FreireF. L.J. Vac. Sci. Technol. A200321L1910.1116/1.16032782003JVST...21L..19L
KnuthD.The Art of Computer Programming1973ReadingAddison-Wesley
BirdG. A.Molecular Gas Dynamics and the Direct Simulation of Gas Flows1994OxfordClarendon
V. L. Kovalev and A. N. Yakunchikov, Vestn. Mosk. Univ., Ser. 1: Mat., Mekh., No. 2, 67 (2008).
P. Klapetek (9779_CR11) 2005; 55
A. I. Ukhov (9779_CR4) 2009; 50
Yu. A. Novikov (9779_CR7) 2006; 62
9779_CR13
D. Li (9779_CR2) 2003; 21
9779_CR14
R. P. Cowborn (9779_CR1) 2000; 358
9779_CR9
D. Knuth (9779_CR16) 1973
T. Savada (9779_CR5) 1996; 47
9779_CR6
G. V. Dedkov (9779_CR8) 2009; 79
A. P. Khusu (9779_CR15) 1975
G. A. Bird (9779_CR3) 1994
P. Klapetek (9779_CR10) 2004; 102
V. P. Memnonov (9779_CR12) 2004
References_xml – volume: 79
  start-page: 79
  issue: 12
  year: 2009
  ident: 9779_CR8
  publication-title: Zh. Tekh. Fiz.
  contributor:
    fullname: G. V. Dedkov
– volume: 47
  start-page: 795
  year: 1996
  ident: 9779_CR5
  publication-title: Vacuum
  doi: 10.1016/0042-207X(96)00069-3
  contributor:
    fullname: T. Savada
– ident: 9779_CR14
– ident: 9779_CR13
– volume: 358
  start-page: 281
  year: 2000
  ident: 9779_CR1
  publication-title: Philos. Trans. R. Soc. London, Ser. A
  doi: 10.1098/rsta.2000.0532
  contributor:
    fullname: R. P. Cowborn
– volume: 102
  start-page: 51
  year: 2004
  ident: 9779_CR10
  publication-title: Ultramicroscopy
  doi: 10.1016/j.ultramic.2004.08.005
  contributor:
    fullname: P. Klapetek
– volume: 21
  start-page: L19
  year: 2003
  ident: 9779_CR2
  publication-title: J. Vac. Sci. Technol. A
  doi: 10.1116/1.1603278
  contributor:
    fullname: D. Li
– ident: 9779_CR6
– volume-title: Surface Roughness: Probability-Theoretical Approach
  year: 1975
  ident: 9779_CR15
  contributor:
    fullname: A. P. Khusu
– volume: 50
  start-page: 20
  year: 2009
  ident: 9779_CR4
  publication-title: Prikl. Mekh. Tekh. Fiz.
  contributor:
    fullname: A. I. Ukhov
– ident: 9779_CR9
– volume: 62
  start-page: 121
  year: 2006
  ident: 9779_CR7
  publication-title: Tr. Inst. Obshch. Fiz. im. Prokhorova
  contributor:
    fullname: Yu. A. Novikov
– volume: 55
  start-page: 295
  year: 2005
  ident: 9779_CR11
  publication-title: Acta Phys. Slovaca
  contributor:
    fullname: P. Klapetek
– volume-title: Molecular Gas Dynamics and the Direct Simulation of Gas Flows
  year: 1994
  ident: 9779_CR3
  doi: 10.1093/oso/9780198561958.001.0001
  contributor:
    fullname: G. A. Bird
– volume-title: The Art of Computer Programming
  year: 1973
  ident: 9779_CR16
  contributor:
    fullname: D. Knuth
– start-page: 89
  volume-title: Parallel Computational Fluid Dynamics-Advance Numerical Methods: Software and Applications
  year: 2004
  ident: 9779_CR12
  contributor:
    fullname: V. P. Memnonov
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Snippet A statistical model of surface roughness is developed to calculate the molecular flows in nanosystems. In this model, surface asperities are represented by a...
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StartPage 1802
SubjectTerms Analysis
Classical and Continuum Physics
Electron and Ion Emission
Hard disks
Monte Carlo method
Physics
Physics and Astronomy
Surface
Toy industry
Title Experimental estimation of the surface roughness distribution parameters in nanochannels
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