Soft X-ray Absorption Study of III-V Nitrides

Soft X-ray Absorption Study of III-V Nitrides

The soft X-ray absorption measurement around nitrogen K and aluminum K edge of the wurtzite AlN, GaN and their ternary compounds AlGaN have been performed. The incidence light angle dependence of the absorption spectra were clearly observed in all samples. A numerical component analysis is presented...

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Bibliographic Details
Published in:Japanese Journal of Applied Physics Vol. 38; no. S1; p. 538
Main Authors: Fukui, Kazutoshi, Hirai, Ryousuke, Yamamoto, Akio, Naoe, Syun-ichi, Tanaka, Satoru
Format: Journal Article
Language:English
Published: 01-01-1999
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Summary:The soft X-ray absorption measurement around nitrogen K and aluminum K edge of the wurtzite AlN, GaN and their ternary compounds AlGaN have been performed. The incidence light angle dependence of the absorption spectra were clearly observed in all samples. A numerical component analysis is presented to separate the experimental K-absorption spectra into three partial spectra which correspond to in-plane, out-of-plane and angular independent components of the unoccupied p partial density of states.
ISSN:0021-4922
1347-4065
DOI:10.7567/JJAPS.38S1.538