X-ray topography study of microsegregation in crystals

X-ray topography study of microsegregation in crystals

Concentration microinhomogeneities in crystals were characterized using x-ray topography, digital image processing, and spectral analysis of signals. Based on the features in lattice strains in such layered inhomogeneous crystals, methods for optimizing the conditions of x-ray topography detection o...

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Bibliographic Details
Published in:Surface investigation, x-ray, synchrotron and neutron techniques Vol. 1; no. 3; pp. 260 - 264
Main Authors: Prokhorov, I. A., Bezbakh, I. Z., Zakharov, B. G., Shul’pina, I. L.
Format: Journal Article
Language:English
Published: New York Springer Nature B.V 01-06-2007
Subjects:
Crystal lattices
Digital imaging
Image processing
Lattice strain
Signal processing
Spectrum analysis
Striations
Topography
X ray topography
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Summary:Concentration microinhomogeneities in crystals were characterized using x-ray topography, digital image processing, and spectral analysis of signals. Based on the features in lattice strains in such layered inhomogeneous crystals, methods for optimizing the conditions of x-ray topography detection of growth striations were proposed to obtain quantitative information on the composition fluctuation amplitude and spatial characteristics.
ISSN:1027-4510
1819-7094
DOI:10.1134/S1027451007030056