Electroluminescence parameters of thin-film ZnS: Mn electroluminescent devices

A new technique is suggested that makes it possible to determine the probability of radiative recombination of impact-excited Mn2+ luminescence centers, as well as to find the time dependences of the electron multiplication factor, impact ionization length, and impact ionization coefficient from the...

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Bibliographic Details

Published in:	Technical physics Vol. 51; no. 8; pp. 1012 - 1024
Main Authors:	Gurin, N. T., Sabitov, O. Yu
Format:	Journal Article
Language:	English
Published:	New York Springer Nature B.V 01-08-2006
Subjects:	Electroluminescence Ionization coefficients Multiplication Phosphors Radiative recombination Thin films
Online Access:	Get full text
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