Applicability of TOF-SIMS for the assessment of lipid composition of cell membrane structures

• Published in: Biochemistry (Moscow). Supplement series A, Membrane and cell biology Vol. 11; no. 2; pp. 144 - 150
• Main Authors: Gulin, A. A., Pavlyukov, M. S., Gusev, S. A., Malakhova, Yu. N., Buzin, A. I., Chvalun, S. N., Aldarov, K. G., Klinov, D. V., Gularyan, S. K., Nadtochenko, V. A.
• Format: Journal Article
• Language: English
• Published: Moscow Pleiades Publishing 01-04-2017; Springer Nature B.V
• Subjects: Atomic force microscopy; Biomedical and Life Sciences; Brain tumors; Cell Biology; Cell surface; Cellular biology; Electron microscopy; Glioma; Glioma cells; In vitro methods and tests; Langmuir-Blodgett films; Life Sciences; Lipid composition; Lipids; Mass spectrometry; Mass spectroscopy; Membrane structures; Membranes; Plasma membranes; Quantitative analysis; Scanning electron microscopy; Secondary ion mass spectrometry; Water analysis; Langmuir–Blodgett films; mass spectrometry; quantitative analysis; TOF-SIMS; ion beam etching
• ISSN: 1990-7478; 1990-7494
• DOI: 10.1134/S1990747817020052

Langmuir–Blodgett lipid films and plasma membranes of glioma cells were analyzed using timeof-flight secondary ion mass spectrometry (TOF-SIMS). Bi
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primary ion beam was determined to be most efficient in various experimental setups. TOF-SIMS was shown to be applicable for a quantitative analysis of model lipid structures, as well as plasma membranes of glioma cells U87MG in vitro. A combination of atomic-force microscopy and scanning electron microscopy yielded the depth resolution of ~10–20 nm for cell surface scanning by primary ion beam.