Characterization survey of GaxIn1-xAs/InAsyP1-y double heterostructures and InAsyP1-y multilayers grown on InP

Low-bandgap, lattice-mismatched GaxIn1-xAs (GaInAs) grown using InAsyP1-y (InAsP) compositional-step grades on InP is a primary choice for light-absorbing, active layers in high-efficiency thermophotovoltaic (TPV) devices. The GaInAs/InAsP double heterostructures (DHs) show exceptional minority carr...

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Published in:Journal of electronic materials Vol. 33; no. 3; pp. 185 - 193
Main Authors: AHRENKIEL, S. P, WANLASS, M. W, CARAPELLA, J. J, GEDVILAS, L. M, KEYES, B. M, AHRENKIEL, R. K, MOUTINHO, H. R
Format: Journal Article
Language:English
Published: New York, NY Institute of Electrical and Electronics Engineers 01-03-2004
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Summary:Low-bandgap, lattice-mismatched GaxIn1-xAs (GaInAs) grown using InAsyP1-y (InAsP) compositional-step grades on InP is a primary choice for light-absorbing, active layers in high-efficiency thermophotovoltaic (TPV) devices. The GaInAs/InAsP double heterostructures (DHs) show exceptional minority carrier lifetimes of up to several microseconds. Authors have performed a characterization survey of 0.4-0.6-eV GaInAs/InAsP DHs using a variety of techniques, including TEM. Dislocations are rarely observed to thread into the GaInAs active layers from the InAsP buffer layers that terminate the graded regions. Nearly complete strain relaxation occurs in buried regions of the InAsP grades. The buffer-layer strain prior to deposition of the active layer is virtually independent of the net misfit. Foreknowledge of this buffer-layer strain is essential to correctly lattice match the buffer to the GaInAsactive layer. 41 refs.
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ISSN:0361-5235
1543-186X
DOI:10.1007/s11664-004-0178-7