A BICS for CMOS OpAmps by Monitoring the Supply Current Peak

Issue Title: Special Issue on the Eighth IEEE International On-Line Testing Workshop (IOLTW'02) We present a Built-In-Current-Sensor (BICS) based on monitoring a signature of the supply current peak of CMOS OpAmps using the oscillation-test-strategy. The BICS takes a weighted sample of the curr...

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Bibliographic Details
Published in:	Journal of electronic testing Vol. 19; no. 5; pp. 597 - 603
Main Authors:	Font, J, Ginard, J, Picos, R, Isern, E, Segura, J, Roca, M, García, E
Format:	Journal Article
Language:	English
Published:	Boston Springer Nature B.V 01-10-2003
Subjects:	Studies
Online Access:	Get full text
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Summary:	Issue Title: Special Issue on the Eighth IEEE International On-Line Testing Workshop (IOLTW'02) We present a Built-In-Current-Sensor (BICS) based on monitoring a signature of the supply current peak of CMOS OpAmps using the oscillation-test-strategy. The BICS takes a weighted sample of the current through two OpAmp current branches and monitors a signature of the peak value under oscillation. Two current-based comparators and some digital circuitry are used to provide a pass/fail flag. Simulation results demonstrate a high defect coverage with a very small impact both on the OpAmp nominal operation and the area overhead.[PUBLICATION ABSTRACT]
Bibliography:	ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23
ISSN:	0923-8174 1573-0727
DOI:	10.1023/A:1025134232544