Positronium formation from porous silica in backscattering and transmission geometries

The Aarhus positron beam line is utilised to measure the positronium formation fraction from porous silica thin films created by the Glancing Angle Deposition technique. The highest formation fraction found from these studies in a backscattering geometry is (57.7 ± 1.0)% in good agreement with other...

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Bibliographic Details
Published in:	The European physical journal. D, Atomic, molecular, and optical physics Vol. 68; no. 5
Main Authors:	Andersen, Søren L., Johansen, Rasmus R., Overgaard, Jakob B., Mortensen, Johan K., Andersen, Kristoffer K., Thomsen, Heine D., Lund, Mikkel D., Chevallier, Jacques, Knudsen, Helge, Uggerhøj, Ulrik I.
Format:	Journal Article
Language:	English
Published:	Berlin/Heidelberg Springer Berlin Heidelberg 15-05-2014 EDP Sciences
Subjects:	Applications of Nonlinear Dynamics and Chaos Theory Atomic Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Molecular Optical and Plasma Physics Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Other interactions of matter with particles and radiation Physical Chemistry Physics Physics and Astronomy Positron annihilation Quantum Information Technology Quantum Physics Regular Article Spectroscopy/Spectrometry Spintronics Topical issue: Electron and Positron Induced Processes Normal Thickness Transmission Geometry Porous Silica Formation Fraction Carbon Foil Thin films Positron annihilation Nanostructures Positronium Porous materials
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