Positronium formation from porous silica in backscattering and transmission geometries
The Aarhus positron beam line is utilised to measure the positronium formation fraction from porous silica thin films created by the Glancing Angle Deposition technique. The highest formation fraction found from these studies in a backscattering geometry is (57.7 ± 1.0)% in good agreement with other...
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| Published in: | The European physical journal. D, Atomic, molecular, and optical physics Vol. 68; no. 5 |
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| Main Authors: | , , , , , , , , , |
| Format: | Journal Article |
| Language: | English |
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15-05-2014
EDP Sciences |
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| Abstract | The Aarhus positron beam line is utilised to measure the positronium formation fraction from porous silica thin films created by the Glancing Angle Deposition technique. The highest formation fraction found from these studies in a backscattering geometry is (57.7 ± 1.0)% in good agreement with other measurements. In transmission mode, the maximum positronium output is found to be (12.5 ± 0.5)%. These are the first measurements of positronium formation in transmission of a porous silica thin film, a starting point for future attempts to optimise the positronium formation in transmission. |
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| AbstractList | The Aarhus positron beam line is utilised to measure the positronium formation fraction from porous silica thin films created by the Glancing Angle Deposition technique. The highest formation fraction found from these studies in a backscattering geometry is (57.7 ± 1.0)% in good agreement with other measurements. In transmission mode, the maximum positronium output is found to be (12.5 ± 0.5)%. These are the first measurements of positronium formation in transmission of a porous silica thin film, a starting point for future attempts to optimise the positronium formation in transmission. |
| ArticleNumber | 124 |
| Author | Johansen, Rasmus R. Knudsen, Helge Uggerhøj, Ulrik I. Andersen, Kristoffer K. Lund, Mikkel D. Andersen, Søren L. Chevallier, Jacques Overgaard, Jakob B. Mortensen, Johan K. Thomsen, Heine D. |
| Author_xml | – sequence: 1 givenname: Søren L. surname: Andersen fullname: Andersen, Søren L. email: sla@phys.au.dk organization: Department of Physics and Astronomy, Aarhus University – sequence: 2 givenname: Rasmus R. surname: Johansen fullname: Johansen, Rasmus R. organization: Department of Physics and Astronomy, Aarhus University – sequence: 3 givenname: Jakob B. surname: Overgaard fullname: Overgaard, Jakob B. organization: Department of Physics and Astronomy, Aarhus University – sequence: 4 givenname: Johan K. surname: Mortensen fullname: Mortensen, Johan K. organization: Department of Physics and Astronomy, Aarhus University – sequence: 5 givenname: Kristoffer K. surname: Andersen fullname: Andersen, Kristoffer K. organization: Department of Physics and Astronomy, Aarhus University – sequence: 6 givenname: Heine D. surname: Thomsen fullname: Thomsen, Heine D. organization: Department of Physics and Astronomy, Aarhus University – sequence: 7 givenname: Mikkel D. surname: Lund fullname: Lund, Mikkel D. organization: Department of Physics and Astronomy, Aarhus University – sequence: 8 givenname: Jacques surname: Chevallier fullname: Chevallier, Jacques organization: Department of Physics and Astronomy, Aarhus University – sequence: 9 givenname: Helge surname: Knudsen fullname: Knudsen, Helge organization: Department of Physics and Astronomy, Aarhus University – sequence: 10 givenname: Ulrik I. surname: Uggerhøj fullname: Uggerhøj, Ulrik I. organization: Department of Physics and Astronomy, Aarhus University |
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| Cites_doi | 10.1103/PhysRevLett.108.043401 10.1103/RevModPhys.60.701 10.1116/1.579579 10.1016/j.nimb.2004.03.055 10.1142/S0217751X04020142 10.1103/PhysRevLett.41.1828 10.1103/PhysRevB.40.2045 10.1103/PhysRevLett.33.7 10.1103/PhysRevB.32.7048 10.1103/PhysRevLett.104.243401 10.1103/PhysRev.103.1258 10.1103/PhysRevA.81.052703 10.1016/j.nimb.2004.03.051 10.1103/PhysRevB.49.454 10.1103/PhysRevA.81.012715 10.1103/PhysRevB.81.235418 10.1103/PhysRevA.26.490 10.1116/1.2131079 10.1063/1.103856 10.1063/1.1681180 10.1038/nature06094 10.1103/PhysRevB.58.12676 10.1088/0034-4885/62/1/001 10.1063/1.97441 |
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| Keywords | Normal Thickness Transmission Geometry Porous Silica Formation Fraction Carbon Foil Thin films Positron annihilation Nanostructures Positronium Porous materials |
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| Snippet | The Aarhus positron beam line is utilised to measure the positronium formation fraction from porous silica thin films created by the Glancing Angle Deposition... |
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| SubjectTerms | Applications of Nonlinear Dynamics and Chaos Theory Atomic Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Molecular Optical and Plasma Physics Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Other interactions of matter with particles and radiation Physical Chemistry Physics Physics and Astronomy Positron annihilation Quantum Information Technology Quantum Physics Regular Article Spectroscopy/Spectrometry Spintronics Topical issue: Electron and Positron Induced Processes |
| Title | Positronium formation from porous silica in backscattering and transmission geometries |
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