Regularities of application of glow discharge spectrometry for quantitative layer-by-layer analysis of thin coatings
Regularities of application of glow discharge spectrometry are considered for quantitative layer-by-layer analysis of thin coatings on steels. The known methods of surface analysis used in industry and in research are compared. The main fields of application of glow discharge spectrometry are consid...
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Published in: | Inorganic materials Vol. 47; no. 14; pp. 1584 - 1591 |
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Format: | Journal Article |
Language: | English |
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SP MAIK Nauka/Interperiodica
01-12-2011
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Abstract | Regularities of application of glow discharge spectrometry are considered for quantitative layer-by-layer analysis of thin coatings on steels. The known methods of surface analysis used in industry and in research are compared. The main fields of application of glow discharge spectrometry are considered. The key causes for distortion of the analytical signal shape in quantitative layer-by-layer analysis using glow discharge spectrometers are discussed: the effect of the etching pit shape, analytical noise, and regularities of surface geometry of the studied samples. The main limitations of the methods in analysis of thin layers and coatings are shown. Calibration samples are developed for control of the thickness of thin chromium electrochemical coatings on steels. Metrological characteristics are estimated in measurement of the coating thickness. A method of quantitative layer-by-layer analysis on SA-2000 and GDS 850A glow discharge spectrometers (LECO) is proposed. |
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AbstractList | Regularities of application of glow discharge spectrometry are considered for quantitative layer-by-layer analysis of thin coatings on steels. The known methods of surface analysis used in industry and in research are compared. The main fields of application of glow discharge spectrometry are considered. The key causes for distortion of the analytical signal shape in quantitative layer-by-layer analysis using glow discharge spectrometers are discussed: the effect of the etching pit shape, analytical noise, and regularities of surface geometry of the studied samples. The main limitations of the methods in analysis of thin layers and coatings are shown. Calibration samples are developed for control of the thickness of thin chromium electrochemical coatings on steels. Metrological characteristics are estimated in measurement of the coating thickness. A method of quantitative layer-by-layer analysis on SA-2000 and GDS 850A glow discharge spectrometers (LECO) is proposed. |
Author | Shitov, B. A. Grigorovich, K. V. Sprygin, G. S. Vlasova, V. I. |
Author_xml | – sequence: 1 givenname: G. S. surname: Sprygin fullname: Sprygin, G. S. email: engaer@rambler.ru organization: Baikov Institute of Metallurgy and Materials Science, Russian Academy of Sciences – sequence: 2 givenname: K. V. surname: Grigorovich fullname: Grigorovich, K. V. organization: Baikov Institute of Metallurgy and Materials Science, Russian Academy of Sciences – sequence: 3 givenname: B. A. surname: Shitov fullname: Shitov, B. A. organization: AK Lys’va Steelworks JSC – sequence: 4 givenname: V. I. surname: Vlasova fullname: Vlasova, V. I. organization: AK Lys’va Steelworks JSC |
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Cites_doi | 10.1039/a807204c 10.1016/0584-8547(92)80081-Q 10.1016/S0584-8547(96)01623-0 |
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Keywords | layer-by-layer analysis coating plasma parameter spectrometer calibration support glow discharge |
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References | SpryginG.S.GrigorovichK.V.MizotinM.M.KrylovA.S.Zavod. Lab. Diagn. Mater.200874237 TychonoffA.N.ArseninV.Ya.Metody resheniya nekorrektnykh zadach1979MoscowNauka(Methods for Solving Ill-Posed Problems) SpryginG.S.ShibaevS.S.GrigorovichK.V.BakhtinS.V.Zavod. Lab. Diagn. Mater.200773415221:CAS:528:DC%2BD2sXms1Wksbw%3D Pupyshev, L.A., Atomno-emissionnyi spektral’nyi analiz s induktivno svyazannoi plazmoi i tleyushchim razryadom po Grimmu (Atomic-Emission Spectral Analysis with Inductively Coupled Plasma and Grimm-Type Glow Discharge), in Tleyushchii razryad po Grimmu. Fizicheskie osnovy, issledovanie i primenenie v atomno-emissionnom spektral’nom analize (Grimm-Type Glow Discharge. Physics, Research, and Application in Atomic-Emission Spectral Analysis), Yekaterinburg: UGTU-UPI, 2002, Part 1, pp. 3–111. WeissZ.Spectrochim. Acta. P. B.19924785987610.1016/0584-8547(92)80081-Q Angeli, J., Chemical analysis of micron and submicron areas-an advanced stage in materials and surface analysis, European Commission “Progress in analytical chemistry in steel and metals industries,” 1999, pp. 109–119. PaylingR.JonesD.G.BengtsonA.Glow discharge optical emission spectrometry1997Chichester, New YorkJ. Wiley KellnerR.OttoM.WidmerH.M.MermetJ.-M.Analytical Chemistry1998Weinheim, New YorkWiley-VCH KarpovK.A.SavostinA.P.Sal’nikovV.D.Analiticheskii kontrol’ v metallurgicheskom proizvodstve: uchebnoe posobie2006MoscowAkademkniga(Analytical Control in Metallurgical Production: Manual) YangC.IngeneriK.HarrisonW.W.J. Anal. At. Spectrom.19991469369810.1039/a807204c1:CAS:528:DyaK1MXitFOlsrg%3D Bogaerts, A. and Gijbels, R., Spectrochim. Acta. P. B., vol. 52, pp. 765–778. Z. Weiss (9764_CR8) 1992; 47 K.A. Karpov (9764_CR3) 2006 (9764_CR4) 1998 G.S. Sprygin (9764_CR10) 2008; 74 9764_CR1 9764_CR2 G.S. Sprygin (9764_CR6) 2007; 73 A.N. Tychonoff (9764_CR11) 1979 (9764_CR5) 1997 C. Yang (9764_CR7) 1999; 14 9764_CR9 |
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Title | Regularities of application of glow discharge spectrometry for quantitative layer-by-layer analysis of thin coatings |
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