Regularities of application of glow discharge spectrometry for quantitative layer-by-layer analysis of thin coatings

Regularities of application of glow discharge spectrometry are considered for quantitative layer-by-layer analysis of thin coatings on steels. The known methods of surface analysis used in industry and in research are compared. The main fields of application of glow discharge spectrometry are consid...

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Published in:Inorganic materials Vol. 47; no. 14; pp. 1584 - 1591
Main Authors: Sprygin, G. S., Grigorovich, K. V., Shitov, B. A., Vlasova, V. I.
Format: Journal Article
Language:English
Published: Dordrecht SP MAIK Nauka/Interperiodica 01-12-2011
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Abstract Regularities of application of glow discharge spectrometry are considered for quantitative layer-by-layer analysis of thin coatings on steels. The known methods of surface analysis used in industry and in research are compared. The main fields of application of glow discharge spectrometry are considered. The key causes for distortion of the analytical signal shape in quantitative layer-by-layer analysis using glow discharge spectrometers are discussed: the effect of the etching pit shape, analytical noise, and regularities of surface geometry of the studied samples. The main limitations of the methods in analysis of thin layers and coatings are shown. Calibration samples are developed for control of the thickness of thin chromium electrochemical coatings on steels. Metrological characteristics are estimated in measurement of the coating thickness. A method of quantitative layer-by-layer analysis on SA-2000 and GDS 850A glow discharge spectrometers (LECO) is proposed.
AbstractList Regularities of application of glow discharge spectrometry are considered for quantitative layer-by-layer analysis of thin coatings on steels. The known methods of surface analysis used in industry and in research are compared. The main fields of application of glow discharge spectrometry are considered. The key causes for distortion of the analytical signal shape in quantitative layer-by-layer analysis using glow discharge spectrometers are discussed: the effect of the etching pit shape, analytical noise, and regularities of surface geometry of the studied samples. The main limitations of the methods in analysis of thin layers and coatings are shown. Calibration samples are developed for control of the thickness of thin chromium electrochemical coatings on steels. Metrological characteristics are estimated in measurement of the coating thickness. A method of quantitative layer-by-layer analysis on SA-2000 and GDS 850A glow discharge spectrometers (LECO) is proposed.
Author Shitov, B. A.
Grigorovich, K. V.
Sprygin, G. S.
Vlasova, V. I.
Author_xml – sequence: 1
  givenname: G. S.
  surname: Sprygin
  fullname: Sprygin, G. S.
  email: engaer@rambler.ru
  organization: Baikov Institute of Metallurgy and Materials Science, Russian Academy of Sciences
– sequence: 2
  givenname: K. V.
  surname: Grigorovich
  fullname: Grigorovich, K. V.
  organization: Baikov Institute of Metallurgy and Materials Science, Russian Academy of Sciences
– sequence: 3
  givenname: B. A.
  surname: Shitov
  fullname: Shitov, B. A.
  organization: AK Lys’va Steelworks JSC
– sequence: 4
  givenname: V. I.
  surname: Vlasova
  fullname: Vlasova, V. I.
  organization: AK Lys’va Steelworks JSC
BookMark eNp9UMlOwzAQtVCRaAsfwM0_EPA4TpoeUcUmVUJiOUeuM05dpXawXVD-HqflhsTpzcxbpHkzMrHOIiHXwG4AcnH7xhhnUFYFAAjGeXlGplCyKsthwSdkOtLZyF-QWQg7xpgoquWUxFdsD530JhoM1Gkq-74zSkbj7Li2nfumjQlqK32LNPSoond7jH6g2nn6eZA2mpj0X0g7OaDPNkN2HKi0shuCOcbGrbFUuaSzbbgk51p2Aa9-cU4-Hu7fV0_Z-uXxeXW3zhQXLGbIpSxKrVlTKeSNWADXUIpKSLXcNFA2Ra75plg0hVJCCZGuCBq5VqVKWORzAqdc5V0IHnXde7OXfqiB1WNt9Z_akoefPCFpbYu-3rmDT5-Ef0w_9il0yQ
Cites_doi 10.1039/a807204c
10.1016/0584-8547(92)80081-Q
10.1016/S0584-8547(96)01623-0
ContentType Journal Article
Copyright Pleiades Publishing, Ltd. 2011
Copyright_xml – notice: Pleiades Publishing, Ltd. 2011
DBID AAYXX
CITATION
DOI 10.1134/S0020168511140226
DatabaseName CrossRef
DatabaseTitle CrossRef
DatabaseTitleList
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Chemistry
EISSN 1608-3172
EndPage 1591
ExternalDocumentID 10_1134_S0020168511140226
GroupedDBID -58
-5G
-BR
-EM
-Y2
-~C
.86
06C
06D
0R~
0VY
1N0
29I
2J2
2JN
2JY
2KG
2KM
2LR
2P1
2VQ
2~H
30V
4.4
408
409
40D
40E
5GY
5VS
67Z
6NX
8TC
8UJ
95-
95~
96X
AAAVM
AABHQ
AAFGU
AAHNG
AAIAL
AAJKR
AANZL
AARHV
AARTL
AATNV
AATVU
AAUYE
AAWCG
AAYFA
AAYIU
AAYQN
AAYTO
ABBBX
ABBXA
ABDBF
ABDZT
ABECU
ABEFU
ABFGW
ABFTV
ABHLI
ABHQN
ABJNI
ABJOX
ABKAS
ABKCH
ABKTR
ABMNI
ABMQK
ABPTK
ABQBU
ABSXP
ABTEG
ABTHY
ABTKH
ABTMW
ABULA
ABWNU
ABXPI
ACBMV
ACBRV
ACBXY
ACBYP
ACGFS
ACHSB
ACHXU
ACIGE
ACIPQ
ACIWK
ACKNC
ACMDZ
ACMLO
ACOKC
ACOMO
ACTTH
ACVWB
ACWMK
ADHHG
ADHIR
ADINQ
ADKNI
ADKPE
ADMDM
ADOXG
ADRFC
ADTPH
ADURQ
ADYFF
ADZKW
AEBTG
AEFTE
AEGAL
AEGNC
AEJHL
AEJRE
AEKMD
AENEX
AEOHA
AEPYU
AESTI
AEVLU
AEVTX
AEXYK
AFFNX
AFGCZ
AFLOW
AFNRJ
AFQWF
AFWTZ
AFZKB
AGAYW
AGDGC
AGGBP
AGJBK
AGMZJ
AGQMX
AGWZB
AGYKE
AHAVH
AHBYD
AHKAY
AHSBF
AHYZX
AI.
AIAKS
AIIXL
AILAN
AIMYW
AITGF
AJBLW
AJDOV
AJRNO
AKQUC
ALMA_UNASSIGNED_HOLDINGS
AMKLP
AMXSW
AMYLF
AMYQR
AOCGG
ASPBG
AVWKF
AXYYD
AZFZN
B0M
BA0
BGNMA
CAG
COF
CS3
CSCUP
DDRTE
DL5
DNIVK
DPUIP
DU5
EAD
EAP
EBLON
EBS
EIOEI
EJD
EMK
EPL
ESBYG
ESX
FEDTE
FERAY
FFXSO
FIGPU
FINBP
FNLPD
FRRFC
FSGXE
G-Y
G-Z
GGCAI
GGRSB
GJIRD
GNWQR
GQ6
GQ7
GQ8
GXS
HF~
HG6
HMJXF
HQYDN
HRMNR
HVGLF
HZ~
H~9
I-F
IHE
IJ-
IKXTQ
IWAJR
IXC
IXD
IXE
IZIGR
IZQ
I~X
I~Z
J-C
JBSCW
JCJTX
JZLTJ
KDC
KOV
LAK
LLZTM
M4Y
MA-
ML-
N2Q
NB0
NPVJJ
NQJWS
NU0
O9-
O93
O9J
OAM
OVD
P9N
PF0
PT4
QOR
QOS
R89
R9I
RNI
RNS
ROL
RPX
RSV
RZC
RZE
S16
S1Z
S27
S3B
SCM
SDH
SHX
SISQX
SJYHP
SNE
SNPRN
SNX
SOHCF
SOJ
SPISZ
SQXTU
SRMVM
SSLCW
STPWE
SZN
T13
TEORI
TSG
TSK
TSV
TUC
TUS
U2A
UG4
UNUBA
UOJIU
UTJUX
UZXMN
VC2
VFIZW
VH1
W23
W48
WJK
WK8
XU3
Z5O
Z7R
Z7S
Z7V
Z7X
Z7Y
Z7Z
Z83
Z85
Z88
ZMTXR
~8M
~A9
AACDK
AAJBT
AASML
AAYXX
AAYZH
ABAKF
ACAOD
ACDTI
ACZOJ
AEFQL
AEMSY
AFBBN
AGRTI
AIGIU
CITATION
H13
ID FETCH-LOGICAL-c240t-e2aa56ff0d8ce2d4712f16484ac9bd16d53f2b57d5cc4c44c9be1fe2fc6c1fe53
IEDL.DBID AEJHL
ISSN 0020-1685
IngestDate Thu Nov 21 23:48:02 EST 2024
Sat Dec 16 12:04:50 EST 2023
IsPeerReviewed true
IsScholarly true
Issue 14
Keywords layer-by-layer analysis
coating
plasma parameter
spectrometer
calibration
support
glow discharge
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c240t-e2aa56ff0d8ce2d4712f16484ac9bd16d53f2b57d5cc4c44c9be1fe2fc6c1fe53
PageCount 8
ParticipantIDs crossref_primary_10_1134_S0020168511140226
springer_journals_10_1134_S0020168511140226
PublicationCentury 2000
PublicationDate 2011-12-01
PublicationDateYYYYMMDD 2011-12-01
PublicationDate_xml – month: 12
  year: 2011
  text: 2011-12-01
  day: 01
PublicationDecade 2010
PublicationPlace Dordrecht
PublicationPlace_xml – name: Dordrecht
PublicationTitle Inorganic materials
PublicationTitleAbbrev Inorg Mater
PublicationYear 2011
Publisher SP MAIK Nauka/Interperiodica
Publisher_xml – name: SP MAIK Nauka/Interperiodica
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References_xml – volume: 14
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  contributor:
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SSID ssj0004589
Score 1.898677
Snippet Regularities of application of glow discharge spectrometry are considered for quantitative layer-by-layer analysis of thin coatings on steels. The known...
SourceID crossref
springer
SourceType Aggregation Database
Publisher
StartPage 1584
SubjectTerms Chemistry
Chemistry and Materials Science
Industrial Chemistry/Chemical Engineering
Inorganic Chemistry
Materials Science
Title Regularities of application of glow discharge spectrometry for quantitative layer-by-layer analysis of thin coatings
URI https://link.springer.com/article/10.1134/S0020168511140226
Volume 47
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3dS8MwED_c9iCCX1NxfpEHn5TI1iRt9zjm5hTxQSf4NtKkUXG0unWI_72XtJUN9UEfStqQHiW95nfXy_0O4FhyjbAkGJW-ZJRrE1I0YkNqhDQm1IFouySxwV1w8xCe9yxNjvf16yJ5OSsjkm6hzsuOcJvSi1jlWwMBfQI0GipQQ-gRqNu1Tu9qcD3HER4WGzua1N5QxDJ_FLKIRouhUIcw_fX_PNsGrBX2JOnkCrAJS3FSh-VuWcatDitzjINbkN262vMTx6NKUkPmAtj28nGcvhObqWsJlGLi8jAtoQGKImjekreZTFxaGi6SZCzRXqfRB3UnRBb8JlZO9vScEJVKu6l6ug33_d6wO6BF4QWqEOAzGntSCt-Ypg5V7GnEL8-gWxVyqdqRbvlaMONFItBCKa44x964ZWLPKF9hK9gOVJM0iXeBGMR_xgyTAZMoQEdRhPCIKmGavubCa8BJ-QJGrzm_xsj5JYyPvk1rA07L-R8Vn9r099F7fxq9D6vYIQI88t0qB1DNJrP4ECpTPTsqlMy2l8OL_ify781h
link.rule.ids 315,782,786,27933,27934,41073,42142,48344,48347,48357,49649,49652,49662,52153
linkProvider Springer Nature
linkToHtml http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1LT8JAEJ4oHNCDD9SIzz140mwC3d1SjgRBiMhBMfHWbHe7akJahRLjv3d2aROIetBTH9lOmu2037edmW8ALiTXCEuCUelLRrk2AUUSG1AjpDGBboqWKxLrPzRHT8F118rksKIWxmW7FyFJ96Ve9B3htqYXwcq3DAEXBcga1qHMWz5HVy63B-Ob3pJIeJBndtSpvSAPZv5oZBWOVmOhDmJ62_-6uR3YyhklaS9cYBfW4qQKlU7RyK0Km0uag3uQ3bvu81OnpEpSQ5ZC2PbweZJ-EFurayWUYuIqMa2kAZoiSHDJ-1wmrjANP5NkIpGx0-iTuh0ic4UTayd7eU2ISqVNq57tw2OvO-70ad56gSqE-IzGnpTCN6auAxV7GhHMM7iwCrhUrUg3fC2Y8SLR1EIprjjHs3HDxJ5RvsKtYAdQStIkPgRikAEwZphsMokGdBRFCJDoFKbuay68GlwWTyB8WyhshG5lwnj4bVprcFXMf5i_bLPfRx_9afQ5VPrju2E4HIxuj2HD_Tx2eSsnUMqm8_gU1md6fpZ72xekHM7u
linkToPdf http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV1LS8NAEB60BR8HH1WxPvfgSVlss7tpepLSB1VLER_gLWx2syqUtLYp4r93dptAi3oQT3mwGUJ2kvk2M983AGeSawxLglHpS0a5NgFFEBtQI6Qxga6JuiOJdR9q_eeg1bYyOVc5F8ZVu-cpyRmnwao0JenlSJusBwm3_F4MXL5FC7hAQASxDEWOCxl09GKjfdPtzQmGB1mVR4XaC7LE5o9GFkPTYl7UhZvO5r9vdAs2MqRJGjPX2IalOCnBajNv8FaC9Tktwh1I711X-rFTWCVDQ-ZS2_bwZTD8IJbDa6WVYuIYmlbqAE0RBL7kfSoTR1jDzycZSETyNPqkbofITPnE2klf3xKihtKWW0924anTfmx2adaSgSoM_SmNPSmFb0xFByr2NEY2z-CCK-BS1SNd9bVgxotETQuluOIcz8ZVE3tG-Qq3gu1BIRkm8T4Qg8iAMcNkjUk0oKMowsCJzmIqvubCK8N5PhvhaKa8EboVC-Pht8dahot8LsLsJZz8PvrgT6NPYeWu1Ql71_3bQ1hz_5RdOcsRFNLxND6G5YmenmSO9wXWRtex
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Regularities+of+application+of+glow+discharge+spectrometry+for+quantitative+layer-by-layer+analysis+of+thin+coatings&rft.jtitle=Inorganic+materials&rft.au=Sprygin%2C+G.+S.&rft.au=Grigorovich%2C+K.+V.&rft.au=Shitov%2C+B.+A.&rft.au=Vlasova%2C+V.+I.&rft.date=2011-12-01&rft.pub=SP+MAIK+Nauka%2FInterperiodica&rft.issn=0020-1685&rft.eissn=1608-3172&rft.volume=47&rft.issue=14&rft.spage=1584&rft.epage=1591&rft_id=info:doi/10.1134%2FS0020168511140226&rft.externalDocID=10_1134_S0020168511140226
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0020-1685&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0020-1685&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0020-1685&client=summon