X-ray topography contrast of edge dislocations perpendicular to the 6H-SiC crystal surface

X-ray topography contrast of edge dislocations perpendicular to the 6H-SiC crystal surface

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Bibliographic Details
Published in:Technical physics letters Vol. 31; no. 6; pp. 491 - 493
Main Authors: Okunev, A. O., Shul’pina, I. L.
Format: Journal Article
Language:English
Published: 01-01-2005
Online Access:Get full text
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Description
ISSN:1063-7850
1090-6533
DOI:10.1134/1.1969776