Check of semiconductor thermal resistance elements by the method of noise thermometry

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Bibliographic Details
Published in:	Measurement techniques Vol. 25; no. 3; pp. 244 - 246
Main Authors:	Kisilevskii, A. B., Plotnikova, S. P., Sokolov, N. A., Eismont, A. I.
Format:	Journal Article
Language:	English
Published:	01-03-1982
Online Access:	Get full text
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