Check of semiconductor thermal resistance elements by the method of noise thermometry

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Published in:Measurement techniques Vol. 25; no. 3; pp. 244 - 246
Main Authors: Kisilevskii, A. B., Plotnikova, S. P., Sokolov, N. A., Eismont, A. I.
Format: Journal Article
Language:English
Published: 01-03-1982
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Author Sokolov, N. A.
Eismont, A. I.
Kisilevskii, A. B.
Plotnikova, S. P.
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PublicationTitle Measurement techniques
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References BF00831329_CR2
M. P. Orlova (BF00831329_CR1) 1975
A. A. Borisov (BF00831329_CR3) 1980
References_xml – volume-title: Summary of Reports, Second All-Union Seminar “Problems of Metrological Security for Processing Systems of Measured Data”
  year: 1980
  ident: BF00831329_CR3
  contributor:
    fullname: A. A. Borisov
– volume-title: Low-Temperature Thermometry [in Russian]
  year: 1975
  ident: BF00831329_CR1
  contributor:
    fullname: M. P. Orlova
– ident: BF00831329_CR2
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StartPage 244
Title Check of semiconductor thermal resistance elements by the method of noise thermometry
Volume 25
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