Leveraging Atomistic Modeling during Precursor Design for Cobalt Film Deposition

Atomic Layer Deposition (ALD) is used to fabricate ultrathin and conformal thin film structures for many semiconductor and thin film device applications. ALD is particularly advantageous for integrated circuit manufacturing which requires control of film structure in the nanometer or sub-nanometer s...

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Bibliographic Details
Published in:Computer Aided Chemical Engineering Vol. 44; pp. 157 - 162
Main Authors: Adamczyk, Andrew J., Cooper, Alan C., Kim, Moo-Sung, Ivanov, Sergei V.
Format: Book Chapter
Language:English
Published: 2018
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Online Access:Get full text
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