Ion beam dosimetry using Gafchromic EBT3 film
The objective of this study was to investigate the use of EBT3 film, specifically the active layer, for monitoring low-energy ion beams. The film’s wettability was enhanced, and its surface free energy increased by 200% after irradiation, as determined by the contact angle technique. SEM analysis sh...
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Published in: | Applied physics. A, Materials science & processing Vol. 130; no. 6 |
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Main Authors: | , , , , , |
Format: | Journal Article |
Language: | English |
Published: |
Berlin/Heidelberg
Springer Berlin Heidelberg
01-06-2024
Springer Nature B.V |
Subjects: | |
Online Access: | Get full text |
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Summary: | The objective of this study was to investigate the use of EBT3 film, specifically the active layer, for monitoring low-energy ion beams. The film’s wettability was enhanced, and its surface free energy increased by 200% after irradiation, as determined by the contact angle technique. SEM analysis showed that the surface of the film became rougher, with a needle-like structure, and increased from 80 nm for the pristine sample to 116 nm for the sample exposed to the highest fluence. XRD analysis revealed an increase in crystallite dimension and a decrease in crystallinity. ATR-FTIR analysis demonstrated that the modified film is sensitive to low-energy ion beams, with certain bands showing significant changes that can be controlled by adjusting the ion fluence. These changes affect the color properties of the EBT3 film, which can be used to monitor the ion beam. The visible spectrum exhibited two distinct colors: blue at 648 nm and red at 596 nm. The blue-to-red ratio was calibrated based on the applied fluence using a polynomial function. The film’s net optical density was separately analyzed for each color, with the blue color being dominant. However, the red color accurately calibrated the film’s response to low-energy ion beams with a usable fluence of up to 1 × 10
17
ion/cm
2
. In conclusion, low-energy ion beams caused significant structural and optical changes in the active layer of EBT3 films, which can be controlled and customized for monitoring ion beams. |
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ISSN: | 0947-8396 1432-0630 |
DOI: | 10.1007/s00339-024-07607-3 |