The O2/H2O redox couple as the origin of the structural/electronic defects in polyanilines
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Published in: | Synthetic metals Vol. 139; no. 1; pp. 175 - 186 |
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Main Authors: | , , , |
Format: | Journal Article |
Language: | English |
Published: |
Lausanne
Elsevier Science
08-08-2003
Amsterdam New York, NY |
Subjects: | |
Online Access: | Get full text |
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ISSN: | 0379-6779 1879-3290 |
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DOI: | 10.1016/S0379-6779(03)00126-7 |