The O2/H2O redox couple as the origin of the structural/electronic defects in polyanilines

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Bibliographic Details
Published in:Synthetic metals Vol. 139; no. 1; pp. 175 - 186
Main Authors: GRUGER, A, REGIS, A, EL KHALKI, A, COLOMBAN, Ph
Format: Journal Article
Language:English
Published: Lausanne Elsevier Science 08-08-2003
Amsterdam
New York, NY
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Description
ISSN:0379-6779
1879-3290
DOI:10.1016/S0379-6779(03)00126-7