A capacitance sensor for on-line monitoring of ultrathin polymeric film growth

An interdigitated metallic electrode array fabricated using standard photolithography and wet-etching techniques, is applied as a capacitance sensor. A theoretical model is developed which predicts a sensitivity of approximately 2 fF/monomolecular layer, well within the detection capability of moder...

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Bibliographic Details
Published in:IEEE transactions on components, hybrids, and manufacturing technology Vol. 11; no. 2; pp. 184 - 190
Main Authors: Zhou, G.-G., Kowel, S.T., Srinivasan, M.P.
Format: Journal Article
Language:English
Published: New York, NY IEEE 01-06-1988
Institute of Electrical and Electronics Engineers
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Summary:An interdigitated metallic electrode array fabricated using standard photolithography and wet-etching techniques, is applied as a capacitance sensor. A theoretical model is developed which predicts a sensitivity of approximately 2 fF/monomolecular layer, well within the detection capability of modern digital bridges. Experimental data from Langmuir/Blodgett depositions of organic and polymeric films accurately confirm the theoretical predictions. The sensors have also provided the first real-time measurements of water exclusion from such films.< >
ISSN:0148-6411
1558-3082
DOI:10.1109/33.2985