Weibull statistics in short-term dielectric breakdown of thin polyethylene films

Weibull statistics in short-term dielectric breakdown of thin polyethylene films

Results of electric strength tests performed on specimens cut from aged and unaged EPR-insulated HV cables are processed by the two and three parameter Weibull function. It is shown that the latter often fits the experimental data better than the former, but the difference is not significant, except...

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Bibliographic Details
Published in:IEEE transactions on dielectrics and electrical insulation Vol. 1; no. 1; pp. 153 - 159
Main Authors: Cacciari, M., Mazzanti, G., Montanari, G.C.
Format: Journal Article
Language:English
Published: IEEE 01-02-1994
Subjects:
Aging
Dielectric breakdown
Dielectric thin films
Dielectrics and electrical insulation
Electrodes
Performance evaluation
Plastic films
Polyethylene
Statistics
Testing
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Summary:Results of electric strength tests performed on specimens cut from aged and unaged EPR-insulated HV cables are processed by the two and three parameter Weibull function. It is shown that the latter often fits the experimental data better than the former, but the difference is not significant, except, in a few cases, for the lowest percentiles. Therefore, the easier distribution parameter estimation and smaller confidence intervals of parameters and percentiles generally support the use of the two-parameter Weibull function.< >
ISSN:1070-9878
1558-4135
DOI:10.1109/94.300243