Terahertz vision using field effect transistors detectors arrays

An overview of main results concerning THz detection related to plasma nonlinearities in nanometer field effect transistors is presented. In particular nonlinearity and dynamic range of these detectors are discussed. As the main result, we will show some of the first real-world applications of the F...

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Bibliographic Details
Published in:	2018 22nd International Microwave and Radar Conference (MIKON) pp. 711 - 714
Main Authors:	Dyakonova, Nina, Coquillat, Dominique, Teppe, Frederic, Knap, Wojciech, Suszek, Jaroslaw, Siemion, Agnieszka, Sypek, Maciej, But, Dmytro B., Sai, Pavel, Yahniuk, Ivan, Cywinski, Grzegorz, Marczewski, Jacek, Zaborowski, Michal, Tomaszewski, Daniel, Zagrajek, Przemyslaw
Format:	Conference Proceeding
Language:	English
Published:	Warsaw University of Technology 01-05-2018
Subjects:	Detectors FinFETs Image edge detection Logic gates Physics
Online Access:	Get full text
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Summary:	An overview of main results concerning THz detection related to plasma nonlinearities in nanometer field effect transistors is presented. In particular nonlinearity and dynamic range of these detectors are discussed. As the main result, we will show some of the first real-world applications of the FET THz detectors: demonstrators of the imager developed for fast postal security and industrial nondestructive quality control.
DOI:	10.23919/MIKON.2018.8405334